Reliability of InAs/GaAs Quantum Dot Lasers Epitaxially Grown on Silicon von Liu, Alan Y., Herrick, Robert W., Ueda, Osamu, Petroff, Pierre M., Gossard, Arthur C., Bowers, John E.

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Physical Origin of the Optical Degradation of InAs Quantum Dot Lasers von Buffolo, Matteo, Samparisi, Fabio, De Santi, Carlo, Daehwan Jung, Norman, Justin, Bowers, John E., Herrick, Robert W., Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo

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Reliability of Vertical-Cavity Surface-Emitting Lasers von Herrick, Robert W

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A Review of High-Performance Quantum Dot Lasers on Silicon von Norman, Justin C., Jung, Daehwan, Zhang, Zeyu, Wan, Yating, Liu, Songtao, Shang, Chen, Herrick, Robert W., Chow, Weng W., Gossard, Arthur C., Bowers, John E.

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Degradation of 1.3 μm Quantum Dot Laser Diodes for Silicon Photonics: Dependence on the Number of Dot-in-a-Well Layers von Zenari, Michele, Gioannini, Mariangela, Buffolo, Matteo, Tibaldi, Alberto, De Santi, Carlo, Norman, Justin, Shang, Chen, Dumont, Mario, Bowers, John E., Herrick, Robert W., Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo

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The Importance of p-Doping for Quantum Dot Laser on Silicon Performance von Norman, Justin C., Zhang, Zeyu, Jung, Daehwan, Shang, Chen, Kennedy, MJ, Dumont, Mario, Herrick, Robert W., Gossard, Arthur C., Bowers, John E.

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Gradual degradation in InAs quantum dot lasers on Si and GaAs von Hughes, Eamonn T, Shang, Chen, Selvidge, Jennifer, Jung, Daehwan, Wan, Yating, Herrick, Robert W, Bowers, John E, Mukherjee, Kunal

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Recombination-enhanced dislocation climb in InAs quantum dot lasers on silicon von Mukherjee, Kunal, Selvidge, Jennifer, Jung, Daehwan, Norman, Justin, Taylor, Aidan A., Salmon, Mike, Liu, Alan Y., Bowers, John E., Herrick, Robert W.

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Reduced dislocation growth leads to long lifetime InAs quantum dot lasers on silicon at high temperatures von Selvidge, Jennifer, Hughes, Eamonn T., Norman, Justin C., Shang, Chen, Kennedy, M. J., Dumont, Mario, Netherton, Andrew M., Zhang, Zeyu, Herrick, Robert W., Bowers, John E., Mukherjee, Kunal

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Origin of the Diffusion-Related Optical Degradation of 1.3 μm Inas QD-LDs Epitaxially Grown on Silicon Substrate von Buffolo, Matteo, Lain, Federico, Zenari, M., Santi, Carlo De, Norman, Justin, Bowers, John E., Herrick, Robert W., Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo

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Investigation of Current-Driven Degradation of 1.3 μm Quantum-Dot Lasers Epitaxially Grown on Silicon von Buffolo, Matteo, Samparisi, Fabio, Rovere, Lorenzo, De Santi, Carlo, Jung, Daehwan, Norman, Justin, Bowers, John E., Herrick, Robert W., Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo

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Degradation of 1.3 μm InAs Quantum-Dot Laser Diodes: Impact of Dislocation Density and Number of Quantum Dot Layers von Buffolo, M., Rovere, L., De Santi, C., Jung, D., Norman, J., Bowers, J. E., Herrick, R. W., Meneghesso, G., Zanoni, E., Meneghini, M.

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Reliability of Vertical-Cavity Surface-Emitting Lasers von Herrick, Robert W.

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Corrosion-Based Failure of Oxide-Aperture VCSELs von Herrick, Robert W., Dafinca, Alexandru, Farthouat, Philippe, Grillo, Alexander A., McMahon, Stephen J., Weidberg, Anthony R.

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Materials and Reliability Handbook for Semiconductor Optical and Electron Devices von Ueda, Osamu, Pearton, Stephen J

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Failure mode analysis of oxide VCSELs in high humidity and high temperature von Suning Xie, Herrick, R.W., Chamberlin, D., Rosner, S.J., McHugo, S., Girolami, G., Mayonte, M., Seongsin Kim, Widjaja, W.

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Recombination-enhanced dislocation climb in InAs quantum dot lasers on silicon von Mukherjee, Kunal, Selvidge, Jennifer, Jung, Daehwan, Norman, Justin, Taylor, Aidan A., Salmon, Mike, Liu, Alan Y., Bowers, John E., Herrick, Robert W.

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Investigation of Current-Driven Degradation of 1.3 μm Quantum-Dot Lasers Epitaxially Grown on Silicon von Buffolo, Matteo, Samparisi, Fabio, Rovere, Lorenzo, De Santi, Carlo, Jung, Daehwan, Norman, Justin, Bowers, John E., Herrick, Robert W., Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo

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Reliability and Degradation of Vertical-Cavity Surface-Emitting Lasers von Herrick, Robert W.

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One dimensional scaling of 100 ridge waveguide amplifiers von No, K.H., Herrick, R.W., Leung, C., Reinhart, R., Levy, J.L.

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