Subatomic Features on the Silicon (111)-(7 x 7) Surface Observed by Atomic Force Microscopy von Giessibl, Franz J., Hembacher, S., Bielefeldt, H., Mannhart, J.

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Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite von HEMBACHER, S, GIESSIBL, F. J, MANNHART, J, QUATE, C. F

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Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor von Giessibl, F J, Hembacher, S, Herz, M, Schiller, Ch, Mannhart, J

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Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum von Hembacher, S., Giessibl, F.J., Mannhart, J.

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Transport properties of low angle grain boundaries in Y1−xCaxBa2Cu3O7−δ films at high magnetic fields von Weber, A., Schneider, C. W., Hembacher, S., Schiller, Ch, Thiel, S., Mannhart, J.

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Force Microscopy with Light-Atom Probes von Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen

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Revealing the Hidden Atom in Graphite by Low-Temperature Atomic Force Microscopy von Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen, Quate, Calvin F.

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Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy von Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan, Mannhart, Jochen

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Transport properties of low angle grain boundaries in Y 1 − x Ca x Ba 2 Cu 3 O 7 − δ films at high magnetic fields von Weber, A., Schneider, C. W., Hembacher, S., Schiller, Ch, Thiel, S., Mannhart, J.

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Imaging of atomic orbitals with the Atomic Force Microscope - experiments and simulations von Giessibl, F.J., Bielefeldt, H., Hembacher, S., Mannhart, J.

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Electron transport through YBa2Cu3O7-δ grain boundary interfaces between 4.2 and 300 K von SCHNEIDER, C. W, HEMBACHER, S, HAMMERL, G, HELD, R, SCHMEHL, A, WEBER, A, KOPP, T, MANNHART, J

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Electron Transport through YBa 2 Cu 3 O 7 − δ Grain Boundary Interfaces between 4.2 and 300 K von Schneider, C.  W., Hembacher, S., Hammerl, G., Held, R., Schmehl, A., Weber, A., Kopp, T., Mannhart, J.

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Imaging silicon by atomic force microscopy with crystallographically oriented tips von Giessibl, F.J., Hembacher, S., Bielefeldt, H., Mannhart, J.

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Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations von Giessibl, F.J., Bielefeldt, H., Hembacher, S., Mannhart, J.

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Focusing quantum states on surfaces: A route towards the design of ultrasmall electronic devices von Sentef, M., Kampf, A. P., Hembacher, S., Mannhart, J.

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Focussing quantum states von Sentef, M, Kampf, A. P, Hembacher, S, Mannhart, J

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Local spectroscopy and atomic imaging of tunneling current, forces and dissipation on graphite von Hembacher, S, Giessibl, F. J, Mannhart, J, Quate, C. F

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Focussing quantum states von Sentef, M, Kampf, A P, Hembacher, S, Mannhart, J

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Imaging of atomic orbitals with the Atomic Force Microscope - experiments and simulations von Giessibl, F. J, Bielefeldt, H, Hembacher, S, Mannhart, J

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Local spectroscopy and atomic imaging of tunneling current, forces and dissipation on graphite von Hembacher, S, Giessibl, F J, Mannhart, J, Quate, C F

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