LaAlO3 stoichiometry is key to electron liquid formation at LaAlO3/SrTiO3 interfaces von Warusawithana, M. P., Richter, C., Mundy, J. A., Roy, P., Ludwig, J., Paetel, S., Heeg, T., Pawlicki, A. A., Kourkoutis, L. F., Zheng, M., Lee, M., Mulcahy, B., Zander, W., Zhu, Y., Schubert, J., Eckstein, J. N., Muller, D. A., Hellberg, C. Stephen, Mannhart, J., Schlom, D. G.

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Growth of homoepitaxial SrTiO3 thin films by molecular-beam epitaxy von Brooks, C. M., Kourkoutis, L. Fitting, Heeg, T., Schubert, J., Muller, D. A., Schlom, D. G.

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Effect of biaxial strain on the electrical and magnetic properties of (001) La0.7Sr0.3MnO3 thin films von Adamo, C., Ke, X., Wang, H. Q., Xin, H. L., Heeg, T., Hawley, M. E., Zander, W., Schubert, J., Schiffer, P., Muller, D. A., Maritato, L., Schlom, D. G.

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Linear and nonlinear optical properties of BiFeO3 von Kumar, Amit, Rai, Ram C., Podraza, Nikolas J., Denev, Sava, Ramirez, Mariola, Chu, Ying-Hao, Martin, Lane W., Ihlefeld, Jon, Heeg, T., Schubert, J., Schlom, Darrell G., Orenstein, J., Ramesh, R., Collins, Robert W., Musfeldt, Janice L., Gopalan, Venkatraman

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Effect of film thickness and biaxial strain on the curie temperature of EuO von Melville, A., Mairoser, T., Schmehl, A., Birol, T., Heeg, T., Holländer, B., Schubert, J., Fennie, C. J., Schlom, D. G.

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Adsorption-controlled growth of EuO by molecular-beam epitaxy von Ulbricht, R. W., Schmehl, A., Heeg, T., Schubert, J., Schlom, D. G.

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Ferroelectricity in nonstoichiometric SrTiO3 films studied by ultraviolet Raman spectroscopy von Tenne, D. A., Farrar, A. K., Brooks, C. M., Heeg, T., Schubert, J., Jang, H. W., Bark, C. W., Folkman, C. M., Eom, C. B., Schlom, D. G.

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Is there an intrinsic limit to the charge-carrier-induced increase of the Curie temperature of EuO? von Mairoser, T, Schmehl, A, Melville, A, Heeg, T, Canella, L, Böni, P, Zander, W, Schubert, J, Shai, D E, Monkman, E J, Shen, K M, Schlom, D G, Mannhart, J

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Optical band gap and magnetic properties of unstrained EuTiO3 films von Lee, J. H., Ke, X., Podraza, N. J., Kourkoutis, L. Fitting, Heeg, T., Roeckerath, M., Freeland, J. W., Fennie, C. J., Schubert, J., Muller, D. A., Schiffer, P., Schlom, D. G.

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Adsorption-controlled growth of BiMnO3 films by molecular-beam epitaxy von Lee, J. H., Ke, X., Misra, R., Ihlefeld, J. F., Xu, X. S., Mei, Z. G., Heeg, T., Roeckerath, M., Schubert, J., Liu, Z. K., Musfeldt, J. L., Schiffer, P., Schlom, D. G.

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Band alignment between (100)Si and complex rare earth∕transition metal oxides von Afanas’ev, V. V., Stesmans, A., Zhao, C., Caymax, M., Heeg, T., Schubert, J., Jia, Y., Schlom, D. G., Lucovsky, G.

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Ternary rare-earth metal oxide high- k layers on silicon oxide von Zhao, C., Witters, T., Brijs, B., Bender, H., Richard, O., Caymax, M., Heeg, T., Schubert, J., Afanas'ev, V. V., Stesmans, A., Schlom, D. G.

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Adsorption-controlled molecular-beam epitaxial growth of BiFeO3 von Ihlefeld, J. F., Kumar, A., Gopalan, V., Schlom, D. G., Chen, Y. B., Pan, X. Q., Heeg, T., Schubert, J., Ke, X., Schiffer, P., Orenstein, J., Martin, L. W., Chu, Y. H., Ramesh, R.

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Critical thickness of high structural quality SrTiO3 films grown on orthorhombic (101) DyScO3 von Biegalski, M. D., Fong, D. D., Eastman, J. A., Fuoss, P. H., Streiffer, S. K., Heeg, T., Schubert, J., Tian, W., Nelson, C. T., Pan, X. Q., Hawley, M. E., Bernhagen, M., Reiche, P., Uecker, R., Trolier-McKinstry, S., Schlom, D. G.

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Epitaxial growth of europium monoxide on diamond von Melville, A., Mairoser, T., Schmehl, A., Fischer, M., Gsell, S., Schreck, M., Awschalom, D. D., Heeg, T., Holländer, B., Schubert, J., Schlom, D. G.

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Gadolinium scandate thin films as an alternative gate dielectric prepared by electron beam evaporation von Wagner, M., Heeg, T., Schubert, J., Lenk, St, Mantl, S., Zhao, C., Caymax, M., De Gendt, S.

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Enhanced electrical and magnetic properties in La0.7Sr0.3MnO3 thin films deposited on CaTiO3 buffered silicon substrates von Adamo, Carlo, Méchin, Laurence, Theeg, T., Katz, M., Mercone, Sylvana, Guillet, Bruno, Wu, Sheng, Routoure, Jean-Marc, Schubert, J, Zander, W, Misra, R., Schiffer, P., Pan, X.Q., Schlom, D.G.

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Characterization of lanthanum lutetium oxide thin films grown by atomic layer deposition as an alternative gate dielectric von Roeckerath, M., Heeg, T., Lopes, J.M.J., Schubert, J., Mantl, S., Besmehn, A., Myllymäki, P., Niinistö, L.

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Growth and properties of epitaxial rare-earth scandate thin films von HEEG, T, SCHUBERT, J, BUCHAL, C, CICERRELLA, E, FREEOUF, J. L, TIAN, W, JIA, Y, SCHLOM, D. G

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Optical properties of La-based high- K dielectric films von Cicerrella, E., Freeouf, J. L., Edge, L. F., Schlom, D. G., Heeg, T., Schubert, J., Chambers, S. A.

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