Dielectric function representation by B-splines von Johs, Blaine, Hale, Jeffrey S.

Volltext

Spectroscopic ellipsometry characterization of multilayer optical coatings von Hilfiker, James N., Pribil, Greg K., Synowicki, Ron, Martin, Andrew C., Hale, Jeffrey S.

Volltext

Prospects for IR emissivity control using electrochromic structures von HALE, J. S, WOOLLAM, J. A

Volltext

Application of a B-spline model dielectric function to infrared spectroscopic ellipsometry data analysis von Mohrmann, Joel, Tiwald, Thomas E., Hale, Jeffrey S., Hilfiker, James N., Martin, Andrew C.

Volltext

Visible and infrared optical constants of electrochromic materials for emissivity modulation applications von Hale, Jeffrey S., DeVries, Michael, Dworak, Brad, Woollam, John A.

Volltext

Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry von Hilfiker, James N., Stadermann, Michael, Sun, Jianing, Tiwald, Tom, Hale, Jeffrey S., Miller, Philip E., Aracne-Ruddle, Chantel

Volltext

Estimating Depolarization with the Jones Matrix Quality Factor von Hilfiker, James N., Hale, Jeffrey S., Herzinger, Craig M., Tiwald, Tom, Hong, Nina, Schöche, Stefan, Arwin, Hans

Volltext

Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry von Hilfiker, James N., Stadermann, Michael, Sun, Jianing, Tiwald, Tom, Hale, Jeffrey S., Miller, Philip E., Aracne-Ruddle, Chantel

Volltext

Degradation of thin films: comparison between low Earth orbit experiments and laboratory simulations of the space environment von Woollam, John A., Synowicki, R.A., Hale, Jeffrey S., Ianno, N.J., Spady, Blaine L., Moore, Arthur W., Hambourger, Paul

Volltext

Thin film materials exposure to low Earth orbit aboard Space Shuttle von Synowicki, R. A, Hale, Jeffrey S, Spady, Blaine, Reiser, Mike, Nafis, S, Woollam, John A

Volltext

Low earth simulation and materials characterization von Synowki, R. A, Hale, Jeffrey S, Woollam, John A

Volltext

Errata-Low Earth Orbit Simulation and Materials Characterization von Synowicki, R. A, Hale, Jeffrey S, Woollam, John A

Volltext

Low-Earth-orbit exposure of carbon-based materials aboard Shuttle flight STS-46 von Spady, Blaine R, Synowicki, R. A, Hale, Jeffrey S, DeVries, M. J, Woollam, John A, Moore, Arthur W, Lake, Max

Volltext

파장 수정자를 포함하는 반사계, 분광 광도계, 엘립소미터, 및 편광계 시스템 von HE PING, VAN DERSLICE JEREMY A, HERZINGER CRAIG M, WELCH JAMES D, LIPHARDT MARTIN M, MEYER DUANE E, HALE JEFFREY S, GUENTHER BRIAN D, SCHOECHE STEFAN

Volltext bestellen

Through-the-glass optical metrology for mapping 60 cm × 120 cm CdTe photovoltaic panels in off-line and on-line configurations von Jie Chen, Koirala, P., Salupo, C., Collins, R. W., Marsillac, S., Kormanyos, K. R., Johs, B. D., Hale, J. S., Pfeiffer, G. L.

Volltext

Infrared emittance modulation devices using electrochromic crystalline tungsten oxide, polymer conductor, and nickel oxide von Trimble, Chris, DeVries, Michael, Hale, Jeffrey S., Thompson, Daniel W., Tiwald, Thomas E., Woollam, John A.

Volltext

Prospects for IR emissivity control using electrochromic structures 1Presentented at the ICMCTF ’97 Conference, San Diego, CA, USA, April 1997. 1 von Hale, Jeffrey S., Woollam, John A.

Volltext

REFLECTOMETER, SPECTROPHOTOMETER, ELLIPSOMETER AND POLARIMETER SYSTEMS INCLUDING A WAVELENGTH MODIFIER von HALE, Jeffrey S, SCHOECHE, Stefan, MEYER, Duane E, HERZINGER, Craig M, LIPHARDT, Martin M, HE, Ping, VAN DERSLICE, Jeremy A, WELCH, James D, GUENTHER, Brian D

Volltext bestellen

Beam focusing and reflective optics von He, Ping, Liphardt, Martin M, Hale, Jeffrey S, Herzinger, Craig M, Pfeiffer, Galen L

Volltext bestellen

REFLECTOMETER, SPECTROPHOTOMETER, ELLIPSOMETER AND POLARIMETER SYSTEMS INCLUDING A WAVELENGTH MODIFIER von HALE, Jeffrey S, SCHOECHE, Stefan, MEYER, Duane E, HERZINGER, Craig M, LIPHARDT, Martin M, HE, Ping, VAN DERSLICE, Jeremy A, WELCH, James D, GUENTHER, Brian D

Volltext bestellen