Measuring Electrical Resistivity at the Nanoscale in Phase-Change Materials von Zhang, Leifeng, Lorut, Frédéric, Gruel, Kilian, Hÿtch, Martin J., Gatel, Christophe

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Electron microscopy by specimen design: application to strain measurements von Cherkashin, Nikolay, Denneulin, Thibaud, Hÿtch, Martin J.

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New carbon cone nanotip for use in a highly coherent cold field emission electron microscope von Houdellier, Florent, Masseboeuf, Aurélien, Monthioux, Marc, Hÿtch, Martin J.

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Observing and measuring strain in nanostructures and devices with transmission electron microscopy von Hÿtch, Martin J., Minor, Andrew M.

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Nanoscale holographic interferometry for strain measurements in electronic devices von Hÿtch, Martin, Houdellier, Florent, Hüe, Florian, Snoeck, Etienne

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Phase detection limits in off-axis electron holography from pixelated detectors: gain variations, geometric distortion and failure of reference-hologram correction von Hÿtch, Martin, Gatel, Christophe

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Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy von Hÿtch, Martin J., Putaux, Jean-Luc, Pénisson, Jean-Michel

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Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy von Hüe, Florian, Hÿtch, Martin, Bender, Hugo, Houdellier, Florent, Claverie, Alain

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Coupling Electronic Holography and Finite-Element Method Simulations to Measure Electric Fields in Nanocapacitors von Gruel, Kilian, Serra, Raphaël, Zhang, Leifeng, Masseboeuf, Aurélien, Hÿtch, Martin J., Gatel, Christophe

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Differential phase-contrast dark-field electron holography for strain mapping von Denneulin, Thibaud, Houdellier, Florent, Hÿtch, Martin

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Influence of electromechanical coupling on optical properties of InGaN quantum-dot based light-emitting diodes von Barettin, Daniele, Maur, Matthias Auf der, Carlo, Aldo di, Pecchia, Alessandro, Tsatsulnikov, Andrei F, Sakharov, Alexei V, Lundin, Wsevolod V, Nikolaev, Andrei E, Usov, Sergey O, Cherkashin, Nikolay, Hÿtch, Martin J, Karpov, Sergey Yu

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Quadrupoles in Electron Lens Design von Hÿtch, Martin, Hawkes, Peter W

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Mapping electric fields in real nanodevices by operando electron holography von Gatel, Christophe, Zhang, Leigeng, Gruel, Kilian, Lorut, Frédéric, Hÿtch, Martin

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Dynamic scattering theory for dark-field electron holography of 3D strain fields von Lubk, Axel, Javon, Elsa, Cherkashin, Nikolay, Reboh, Shay, Gatel, Christophe, Hÿtch, Martin

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Strain evolution of SiGe-on-insulator obtained by the Ge-condensation technique von Boureau, Victor, Reboh, Shay, Benoit, Daniel, Hÿtch, Martin, Claverie, Alain

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Realization of a tilted reference wave for electron holography by means of a condenser biprism von Röder, Falk, Houdellier, Florent, Denneulin, Thibaud, Snoeck, Etienne, Hÿtch, Martin

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Effects of elastic anisotropy on strain distributions in decahedral gold nanoparticles von Johnson, Craig L., Snoeck, Etienne, Ezcurdia, Manex, Rodríguez-González, Benito, Pastoriza-Santos, Isabel, Liz-Marzán, Luis M., Hÿtch, Martin J.

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Determining the work function of a carbon-cone cold-field emitter by in situ electron holography von de Knoop, Ludvig, Houdellier, Florent, Gatel, Christophe, Masseboeuf, Aurélien, Monthioux, Marc, Hÿtch, Martin

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Studying interface charge distribution in HfO2 and Al2O3 based nanocapacitors by operando electron holography von Zhang, Leifeng, Raza, Muhammad Hamid, Gruel, Kilian, Wu, Rong, Dubourdieu, Catherine, Hÿtch, Martin, Gatel, Christophe

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Quantitative 3D electromagnetic field determination of 1D nanostructures from single projection von Phatak, C., Knoop, L. de, Houdellier, F., Gatel, C., Hÿtch, M.J., Masseboeuf, A.

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