Electromechanical Coupling among Edge Dislocations, Domain Walls, and Nanodomains in BiFeO3 Revealed by Unit-Cell-Wise Strain and Polarization Maps von Lubk, A, Rossell, M. D, Seidel, J, Chu, Y. H, Ramesh, R, Hÿtch, M. J, Snoeck, E

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Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip von Houdellier, F., de Knoop, L., Gatel, C., Masseboeuf, A., Mamishin, S., Taniguchi, Y., Delmas, M., Monthioux, M., Hÿtch, M.J., Snoeck, E.

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Quantitative 3D electromagnetic field determination of 1D nanostructures from single projection von Phatak, C., Knoop, L. de, Houdellier, F., Gatel, C., Hÿtch, M.J., Masseboeuf, A.

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Dynamical effects in strain measurements by dark-field electron holography von Javon, E., Lubk, A., Cours, R., Reboh, S., Cherkashin, N., Houdellier, F., Gatel, C., Hÿtch, M.J.

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Quantitative measurement of displacement and strain fields from HREM micrographs von Hÿtch, M.J., Snoeck, E., Kilaas, R.

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Unlimited acquisition time in electron holography by automated feedback control of transmission electron microscope von Gatel, C., Dupuy, J., Houdellier, F., Hÿtch, M. J.

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Extended Charge Layers in Metal-Oxide-Semiconductor Nanocapacitors Revealed by Operando Electron Holography von Gatel, C., Serra, R., Gruel, K., Masseboeuf, A., Chapuis, L., Cours, R., Zhang, L., Warot-Fonrose, B., Hÿtch, M. J.

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Imaging conditions for reliable measurement of displacement and strain in high-resolution electron microscopy von Hÿtch, M.J., Plamann, T.

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Optimization of off-axis electron holography performed with femtosecond electron pulses von Houdellier, F., Caruso, G.M., Weber, S., Hÿtch, M.J., Gatel, C., Arbouet, A.

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Calibration of projector lens distortions von Hüe, F., Johnson, C. L., Lartigue-Korinek, S., Wang, G., Buseck, P. R., Hÿtch, M. J.

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Evidence of sharp and diffuse domain walls in BiFeO3 by means of unit-cell-wise strain and polarization maps obtained with high resolution scanning transmission electron microscopy von Lubk, A, Rossell, M D, Seidel, J, He, Q, Yang, S Y, Chu, Y H, Ramesh, R, Hÿtch, M J, Snoeck, E

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Dark-field electron holography for the measurement of geometric phase von Hÿtch, M.J., Houdellier, F., Hüe, F., Snoeck, E.

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Mapping stress and strain in nanostructures by high-resolution transmission electron microscopy von Hÿtch, M.J., Houdellier, F.

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Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing von de Knoop, L., Gatel, C., Houdellier, F., Monthioux, M., Masseboeuf, A., Snoeck, E., Hÿtch, M. J.

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Selective growth of tensily strained Si1-yCy films on patterned Si substrates von GOUYE, A, HILE, F, HALIMAOUI, A, KERMARREC, O, CAMPIDELLI, Y, HYTCH, M. J, HOUDELLIER, F, CLAVERIE, A, BENSAHEL, D

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Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique von Warot-Fonrose, B., Houdellier, F., Hÿtch, M.J., Calmels, L., Serin, V., Snoeck, E.

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Strain mapping in nanowires von Taraci, J L, Hÿtch, M J, Clement, T, Peralta, P, McCartney, M R, Drucker, Jeff, Picraux, S T

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Quantitative comparison of high resolution TEM images with image simulations von Hÿtch, M.J., Stobbs, W.M.

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Atomic order in magnetic Mn inclusions in Si crystals: XAS and TEM studies von Wolska, A., Lawniczak-Jablonska, K., Kret, S., Dłużewski, P., Szczepańska, A., Klepka, M., Walczak, M.S., Lefrais, Y., Hÿtch, M.J., Misiuk, A.

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Control of grain size and morphologies of nanograined ferrites by adaptation of the synthesis route: mechanosynthesis and soft chemistry von Guigue-Millot, N., Bégin-Colin, S., Champion, Y., Hÿtch, M.J., Le Caër, G., Perriat, P.

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