Growth diagram and morphologies of AlN thin films grown by molecular beam epitaxy von Koblmueller, G., Averbeck, R., Geelhaar, L., Riechert, H., Hösler, W., Pongratz, P.

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Surface alloy in the c(4 × 4) phase of Pb on Cu(100) von Gauthier, Y., Moritz, W., Hösler, W.

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Determination of the chemical composition of distorted InGaN/GaN heterostructures from x-ray diffraction data von Schuster, M, Gervais, P O, Jobst, B, Hösler, W, Averbeck, R, Riechert, H, Iberl, A, Stömmer, R

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Optimized growth of BGaAs by molecular beam epitaxy von Groenert, M.E, Averbeck, R, Hösler, W, Schuster, M, Riechert, H

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Influence of deposition conditions on Ir/IrO2 oxygen barrier effectiveness von Pinnow, C. U., Kasko, I., Nagel, N., Poppa, S., Mikolajick, T., Dehm, C., Hösler, W., Bleyl, F., Jahnel, F., Seibt, M., Geyer, U., Samwer, K.

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Correlation between domain boundaries and surface steps: a scanning-tunneling-microscopy study on reconstructed Pt(100) von BEHM, R. J, HÖSLER, W, RITTER, E, BINNIG, G

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Depth resolution in Auger depth profile analysis of aluminum metallization in microelectronics: The effect of crystalline texture von Pamler, W., Wangemann, K., Kampermann, S., Hösler, W.

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Sputter deposition of epitaxial Y1Ba2Cu3Ox-films on SrTiO3, MgO, LaAlO3, NdGaO3 and YSZ/sapphire substrates von Gieres, O., Schmidt, H., Hradil, K., Hösler, W., Seeböck, R.

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Combined AES/factor analysis and RBS investigation of a thermally treated Pt/Ti metallisation on SiO2 von SCHEITHAUER, U, HÖSLER, W, BRUCHHAUS, R

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Combined AES/Factor Analysis and RBS Investigation of a Thermally Treated Pt/Ti Metallisation on SiO2 von Scheithauer, U, Hösler, W, Bruchhaus, R

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Evaluation of AES depth profiles of thin-film systems by application of novel graphically interactive factor analysis software von Scheithauer, U., Hösler, W., Riedl, G.

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Effects of crystallinity on depth resolution in sputter depth profiles von Hösler, W., Pamler, W.

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LEED analysis of a dense lead monolayer on copper (100) von Hösler, W., Moritz, W.

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Surface analysis at the sidewalls of VLSI patterns-limitations and capabilities of spatially resolved Auger electron spectroscopy von Hoesler, W

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Influence of the scattering potential model on low energy electron diffraction from Cu(001)−c(2 × 2)-Pb von Hösler, W., Moritz, W., Tamura, E., Feder, R.

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Epitaxial YBa2Cu3Ox thin films on sapphire using a Y-stabilized ZrO2 buffer layer von SCHMIDT, H, HRADIL, K, HOSLER, W, WERSING, W, GIERES, G, SEEBOCK, R. J

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Determination of the chemical composition of distorted InGaN/GaN heterostructures from x-ray diffraction data: Special issue on high resolution x-ray diffraction and topography von SCHUSTER, M, GERVAIS, P. O, JOBST, B, HÖSLER, W, AVERBECK, R, RIECHERT, H, IBERI, A, STÖMMER, R

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Effects of crystallinity on depth resolution in sputter depth profiles : Quantive surface analysis von HÖSLER, W, PAMLER, W

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Sputtered YBa2Cu3Oy thin films on sapphire and silicon substrates using yttria stabilized ZrO2 buffer layers von SCHMIDT, H, HRADIL, K, GIERES, G, HOSLER, W, EIBL, O

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Strength comparisons in untrained men and trained women athletes von Morrow, Jr, J R, Hosler, W W

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