A power-controlled reliability assessment for multi-class probabilistic classifiers von Gweon, Hyukjun

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AN EFFECTIVE BIAS-CORRECTED BAGGING METHOD FOR THE VALUATION OF LARGE VARIABLE ANNUITY PORTFOLIOS von Gweon, Hyukjun, Li, Shu, Mamon, Rogemar

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Automatic Classification of Open-Ended Questions: Check-All-That-Apply Questions von Schonlau, Matthias, Gweon, Hyukjun, Wenemark, Marika

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Use of Prediction Bias in Active Learning and Its Application to Large Variable Annuity Portfolios von Gweon, Hyukjun, Li, Shu, Xu, Yangxuan

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Three Methods for Occupation Coding Based on Statistical Learning von Gweon, Hyukjun, Schonlau, Matthias, Kaczmirek, Lars, Blohm, Michael, Steiner, Stefan

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A nearest neighbor-based active learning method and its application to time series classification von Gweon, Hyukjun, Yu, Hao

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The k conditional nearest neighbor algorithm for classification and class probability estimation von Gweon, Hyukjun, Schonlau, Matthias, Steiner, Stefan H

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Nearest labelset using double distances for multi-label classification von Gweon, Hyukjun, Schonlau, Matthias, Steiner, Stefan H

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A hybrid data mining framework for variable annuity portfolio valuation von Gweon, Hyukjun, Li, Shu

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How reliable is your reliability diagram? von Gweon, Hyukjun, Yu, Hao

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Batch mode active learning framework and its application on valuing large variable annuity portfolios von Gweon, Hyukjun, Li, Shu

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Automated Classification for Open-Ended Questions with BERT von Gweon, Hyukjun, Schonlau, Matthias

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Statistical Learning Approaches to Some Classification Problems von Gweon, Hyukjun

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Automated classification for open-ended questions with BERT von Gweon, Hyukjun, Schonlau, Matthias

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Semi-automated classification for multi-label open-ended questions von Gweon, Hyukjun, Schonlau, Matthias, Wenemark, Marika

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Nearest Labelset Using Double Distances for Multi-label Classification von Gweon, Hyukjun, Schonlau, Matthias, Steiner, Stefan

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Three Methods for Occupation Coding Based on Statistical Learning von Gweon, Hyukjun, Schonlau, Matthias, Kaczmirek, Lars, Blohm, Michael, Steiner, Stefan

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Nearest Labelset Using Double Distances for Multi-label Classification von Gweon, Hyukjun, Schonlau, Matthias, Steiner, Stefan

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