Treffer 1 - 4 von 4 für Suche 'Gwangdoo Jo', Suchdauer: 0,36s Treffer weiter einschränken
  1. 1
    Five-Step (Pad-Pad Short-Pad Open-Short-Open) De-Embedding Method and Its Verification

    Five-Step (Pad-Pad Short-Pad Open-Short-Open) De-Embedding Method and Its Verification von IN MAN KANG, JUNG, Seung-Jae, KIM, Han-Gu, CHOI, Kyu-Myung, CHOI, Tae-Hoon, JUNG, Jae-Hong, CHUNG, Chulho, KIM, Han-Su, OH, Hansu, HYUN WOO LEE, JO, Gwangdoo, KIM, Young-Kwang

    Veröffentlicht in IEEE electron device letters

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  2. 2
    Scalable Model of Substrate Resistance Components in RF MOSFETs With Bar-Type Body Contact Considered Layout Dimensions

    Scalable Model of Substrate Resistance Components in RF MOSFETs With Bar-Type Body Contact Considered Layout Dimensions von IN MAN KANG, JUNG, Seung-Jae, CHOI, Tae-Hoon, LEE, Hyunwoo, JO, Gwangdoo, KIM, Young-Kwang, KIM, Han-Gu, CHOI, Kyu-Myung

    Veröffentlicht in IEEE electron device letters

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  3. 3
    RF Model of BEOL Vertical Natural Capacitor (VNCAP) Fabricated by 45-nm RF CMOS Technology and Its Verification

    RF Model of BEOL Vertical Natural Capacitor (VNCAP) Fabricated by 45-nm RF CMOS Technology and Its Verification von IN MAN KANG, JUNG, Seung-Jae, KIM, Young-Kwang, KIM, Han-Gu, CHOI, Kyu-Myung, CHOI, Tae-Hoon, JUNG, Jae-Hong, CHUNG, Chulho, KIM, Han-Su, PARK, Kangwook, OH, Hansu, LEE, Hyun-Woo, JO, Gwangdoo

    Veröffentlicht in IEEE electron device letters

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  4. 4
    Effect of technology scaling on RF performance of the transistors fabricated by standard CMOS technology

    Effect of technology scaling on RF performance of the transistors fabricated by standard CMOS technology von Han-Su Kim, Chulho Chung, Joohyun Jeong, Seung-Jae Jung, Jinsung Lim, JinHyoun Joe, Jaehoon Park, HyunWoo Lee, Gwangdoo Jo, Kangwook Park, Jedon Kim, Hansu Oh, Jong Shik Yoon


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