SIMS analysis of Rb-doped hollow-core photonic band-gap silica fiber using a CAMECA 4550 instrument von Guryanov, G. M., Slepkov, A. D., Gaeta, A. L., Koch, K. W.

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Cluster ion emission from nitrogen-doped GaAs and optimization of SIMS conditions for nitrogen analysis von Guryanov, G.M.

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Optimization of secondary ion mass spectrometry detection limit for N in SiC von Pivovarov, A. L., Stevie, F. A., Griffis, D. P., Guryanov, G. M.

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Ordering phenomena in InAs strained layer morphological transformation on GaAs (100) surface von Cirlin, G. E., Guryanov, G. M., Golubok, A. O., Tipissev, S. Ya, Ledentsov, N. N., Kop’ev, P. S., Grundmann, M., Bimberg, D.

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F and Cl detection limits in secondary ion mass spectrometry measurements of Si and SiO 2 samples von Pivovarov, A. L., Guryanov, G. M.

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F and Cl detection limits in secondary ion mass spectrometry measurements of Si and SiO2 samples von Pivovarov, A. L., Guryanov, G. M.

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An intermediate (1.0–1.5 monolayers) stage of heteroepitaxial growth of InAs on GaAs(100) during submonolayer molecular beam epitaxy von Guryanov, G.M., Cirlin, G.E., Golubok, A.O., Tipissev, S.Ya, Ledentsov, N.N., Shchukin, V.A., Grundmann, M., Bimberg, D., Alferov, Zh.I.

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Secondary ion mass spectrometry depth profiling of ultrashallow phosphorous in silicon von Loesing, R., Guryanov, G. M., Hunter, J. L., Griffis, D. P.

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Cluster ion emission from nitrogen-doped GaAs and optimization of SIMS conditions for nitrogen analysis von GURYANOV, G. M

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Formation of InGaAs/GaAs quantum dots by submonolayer molecular beam epitaxy von Guryanov, G.M., Cirlin, G.E., Petrov, V.N., Polyakov, N.K., Golubok, A.O., Tipissev, S.Ya, Musikhina, E.P., Gubanov, V.B., Samsonenko, Yu.B., Ledentsov, N.N.

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System for recording and analysis of reflection high-energy electron diffraction patterns von Gur’yanov, G. M., Demidov, V. N., Korneeva, N. P., Petrov, V. N., Samsonenko, Yu. B., Tsyrlin, G. É.

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Software package for reflection high energy electron diffraction beam intensity measurement and analysis system von Cirlin, G. E., Guryanov, G. M., Korneeva, N. P., Samsonenko, Yu. B.

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Dissolution of oxide films on constructional steels von Bobrov, Yu. G., Gur'yanov, G. M., Kovarskii, A. P., Kostikov, Yu. P., Motornyi, A. V.

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Study of the deactivation mechanisms for some constructional steels by secondary-ion mass spectrometry von Bobrov, Yu. G., Bashilov, S. M., Gur'yanov, G. M., Kovarskii, A. P.

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Structural alloy surfaces with chemical processing using the method of secondary ion mass spectrometry von Vashilov, S. M., Bobrov, Yu. G., Gur'yanov, G. M., Kovarskii, A. P., Ulanov, V. E.

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Comparison of secondary ion mass spectroscopy analysis of ultrashallow phosphorus using Cs+, O2+, and CsC6− primary ion beams von Loesing, R., Guryanov, G. M., Phillips, M. S., Griffis, D. P.

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Comparison of secondary ion mass spectroscopy analysis of ultrashallow phosphorus using Cs + , O 2 + , and CsC 6 − primary ion beams von Loesing, R., Guryanov, G. M., Phillips, M. S., Griffis, D. P.

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Comparison of secondary ion mass spectroscopy analysis of ultrashallow phosphorus using Cs super(+), O super(+) sub(2), and CsC super(-) sub(6) primary ion beams von Loesing, R, Guryanov, G M, Phillips, MS, Griffis, D P

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Effect of growth kinetics on the InAs/GaAs quantum dot arrays formation on vicinal surfaces von CIRLIN, G. E, PETROV, V. N, GOLUBOK, A. O, TIPISSEV, S. YA, DUBROVSKII, V. G, GURYANOV, G. M, LEDENTSOV, N. N, BIMBERG, D

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Combined excitation-emission spectroscopy of bismuth active centers in optical fibers von Firstov, S V, Khopin, V F, Bufetov, I A, Firstova, E G, Guryanov, A N, Dianov, E M

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