Total-Electron-Yield Measurements by Soft X-Ray Irradiation of Insulating Organic Films on Conductive Substrates von MURAMATSU, Yasuji, GULLIKSON, Eric M.

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Ion polished Cr/Sc attosecond multilayer mirrors for high water window reflectivity von Guggenmos, Alexander, Radünz, Stefan, Rauhut, Roman, Hofstetter, Michael, Venkatesan, Sriram, Wochnik, Angela, Gullikson, Eric M, Fischer, Stefan, Nickel, Bert, Scheu, Christina, Kleineberg, Ulf

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Optical constants of magnetron-sputtered boron carbide thin films from photoabsorption data in the range 30 to 770 eV von Soufli, Regina, Aquila, Andrew L, Salmassi, Farhad, Fernández-Perea, Mónica, Gullikson, Eric M

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Newly Developed Friction Tester for in situ Soft X-Ray Absorption Measurements of Frictional Engine-Oil/Metals Interfaces von MURAMATSU, Yasuji, OKUYAMA, Masaru, TAKAHASHI, Naoko, OHMORI, Toshihide, GULLIKSON, Eric M.

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Soft X-Ray Emission Spectra of Ru/B4C Multilayers Measured Under X-Ray Standing-Wave Conditions for Non-Destructive Interface Characterization von MURAMATSU, Yasuji, DENLINGER, Jonathan D., GULLIKSON, Eric M.

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X-ray reflective coatings made of Pt, Al2O3/Pt, and Al2O3/Ni/Pt produced by atomic layer deposition von Windt, David L, Li, Huazhi, Gorelikov, Dmitry, Gullikson, Eric M, Gollwitzer, Christian, Krumrey, Michael, Laubis, Christian

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Blazed high-efficiency x-ray diffraction via transmission through arrays of nanometer-scale mirrors von Heilmann, Ralf K, Ahn, Minseung, Gullikson, Eric M, Schattenburg, Mark L

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Advanced low blaze angle x-ray gratings via nanoimprint replication and plasma etch von Voronov, Dmitriy L., Park, Sooyeon, Gullikson, Eric M., Salmassi, Farhad, Padmore, Howard A.

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Bilayer and trilayer X-ray mirror coatings containing W, Pt, or Ir, in combination with C, C/Co, B4C, or B4C/Ni: X-ray reflectance, film stress, and temporal stability von Windt, David L, Conley, Raymond P, Gullikson, Eric M, Gollwitzer, Christian, Krumrey, Michael, Laubis, Christian

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Development of a narrowband multilayer mirror for extracting a single order component from high harmonics in the 63–70  eV region von Yi Liu, Suet, Iwamoto, Yuya, Mashiko, Hiroki, Ichimaru, Satoshi, Hatayama, Masatoshi, Gullikson, Eric M., Mizuno, Tomoya, Kurihara, Takayuki, Itatani, Jiro, Takenaka, Hisataka

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Bilayer and trilayer X-ray mirror coatings containing W, Pt, or Ir, in combination with C, C/Co, B 4 C, or B 4 C/Ni: X-ray reflectance, film stress, and temporal stability von Windt, David L, Conley, Raymond P, Gullikson, Eric M, Gollwitzer, Christian, Krumrey, Michael, Laubis, Christian

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Pd/B4C/Y multilayer coatings for extreme ultraviolet applications near 10  nm wavelength von Windt, David L, Gullikson, Eric M

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Pore Development in Carbonized Hemoglobin by Concurrently Generated MgO Template for Activity Enhancement as Fuel Cell Cathode Catalyst von Maruyama, Jun, Hasegawa, Takahiro, Amano, Taiji, Muramatsu, Yasuji, Gullikson, Eric M, Orikasa, Yuki, Uchimoto, Yoshiharu

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A carbonaceous two-dimensional lattice with FeN4 units von Maruyama, Jun, Amano, Taiji, Inoue, Satoshi, Muramatsu, Yasuji, Yoshizawa, Noriko, Gullikson, Eric M

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Total-Electron-Yield Measurements of Bulk Insulating Materials by Monitoring the Surface Current Induced by Soft X-Ray Irradiation von MURAMATSU, Yasuji, GULLIKSON, Eric M.

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Optical, structural and aging properties of Al/Sc-based multilayers for the extreme ultraviolet von Rebellato, Jennifer, Soufli, Regina, Meltchakov, Evgueni, Gullikson, Eric M., de Rossi, Sébastien, Baumier, Cédric, Pallier, Florian, Delmotte, Franck

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Resonant soft X-ray reflectivity of ultrathin polymer films at the C-edge: A direct approach von Gibaud, Alain, Bal, Jayanta Kumar, Gullikson, Eric M., Wang, Cheng, Vignaud, Guillaume

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X-Ray Absorption Edge of Graphite Evaluated from the Lower Limit of Resonant Inelastic X-Ray Scattering von MURAMATSU, Yasuji, YANG, Wanli, DENLINGER, Jonathan D., GULLIKSON, Eric M.

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X-Ray Performance of Critical-angle Transmission Grating Prototypes for the Arcus Mission von Heilmann, Ralf K., Bruccoleri, Alexander R., Burwitz, Vadim, DeRoo, Casey, Garner, Alan, Günther, Hans Moritz, Gullikson, Eric M., Hartner, Gisela, Hertz, Edward, Langmeier, Andreas, Müller, Thomas, Rukdee, Surangkhana, Schmidt, Thomas, Smith, Randall K., Schattenburg, Mark L.

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Chemical State Analysis of Entrapped Nitrogen in Carbon Nanohorns Using Soft X-ray Emission and Absorption Spectroscopy von Amano, Taiji, Muramatsu, Yasuji, Sano, Noriaki, Denlinger, Jonathan D, Gullikson, Eric M

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