The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features von Santos, Sergio, Barcons, Victor, Christenson, Hugo K, Font, Josep, Thomson, Neil H

Volltext

Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale von Kalinin, S. V. (Sergeĭ Vasilʹevich), Gruverman, A. (Alexei)

Volltext

Rheological studies of PMMA-PVC based polymer blend electrolytes with LiTFSI as doping salt von Liew, Chiam-Wen, Durairaj, R, Ramesh, S

Volltext

Electrostatic Charge on Flying Hummingbirds and Its Potential Role in Pollination von Badger, Marc, Ortega-Jimenez, Victor Manuel, von Rabenau, Lisa, Smiley, Ashley, Dudley, Robert

Volltext

Influence of miscibility phenomenon on crystalline polymorph transition in poly(vinylidene fluoride)/acrylic rubber/clay nanocomposite hybrid von Abolhasani, Mohammad Mahdi, Naebe, Minoo, Jalali-Arani, Azam, Guo, Qipeng

Volltext

Efficient Driving of Piezoelectric Transducers Using a Biaxial Driving Technique von Pichardo, Samuel, Silva, Rafael R C, Rubel, Oleg, Curiel, Laura

Volltext

Effects of fluoridated milk on root dentin remineralization von Arnold, Wolfgang H, Heidt, Bastian A, Kuntz, Sebastian, Naumova, Ella A

Volltext

Conducting polymer electrodes for gel electrophoresis von Bengtsson, Katarina, Nilsson, Sara, Robinson, Nathaniel D

Volltext

Unipolar memristive switching in bulk negative temperature coefficient thermosensitive ceramics von Wu, Hongya, Cai, Kunpeng, Zhou, Ji, Li, Bo, Li, Longtu

Volltext

Principles of Near-Field Microwave Microscopy von Anlage, Steven M., Talanov, Vladimir V., Schwartz, Andrew R.

Volltext

Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy von Kholkin, A. L., Kalinin, S. V., Roelofs, A., Gruverman, A.

Volltext

Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy von Eyben, P., Vandervorst, W., Alvarez, D., Xu, M., Fouchier, M.

Volltext

Principles of Kelvin Probe Force Microscopy von Glatzel, Th, Lux-Steiner, M.Ch, Strassburg, E., Boag, A., Rosenwaks, Y.

Volltext

High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices von Silveira, William R., Muller, Erik M., Ng, Tse Nga, Dunlap, David, Marohn, John A.

Volltext

Electromechanical Behavior in Biological Systems at the Nanoscale von Gruverman, Alexei, Rodriguez, Brian J., Kalinin, Sergei V.

Volltext

Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics von Kopanski, J. J.

Volltext

Kelvin Probe Force Microscopy of Semiconductors von Rosenwaks, Y., Saraf, S., Tal, O., Schwarzman, A., Glatzel, Th, Lux-Steiner, M. Ch

Volltext

Frequency-Dependent Transport Imaging by Scanning Probe Microscopy von O’Hayre, Ryan, Lee, Minhwan, Prinz, Fritz B., Kalinin, Sergei V.

Volltext

Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport von Baddorf, A. P.

Volltext

Near-Field High-Frequency Probing von Paulson, C. A., Van Der Weide, D. W.

Volltext