Advancing technology environments for learning communities von Amundrud, Anja, Smørdal, Ole, Zhang, Jianwei, Chen, Mei-Hwa, Kalir, Remi, Chen, Bodong, Chang, Yu-Hui, Groos, David, Wiebe, Joel, Slotta, Jim, Hod, Yotam

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A review of functions, attributes, properties and measurements for the quality control of proton exchange membrane fuel cell components von Yuan, Xiao-Zi, Nayoze-Coynel, Christine, Shaigan, Nima, Fisher, David, Zhao, Nana, Zamel, Nada, Gazdzicki, Pawel, Ulsh, Michael, Friedrich, Kaspar Andreas, Girard, Francois, Groos, Ulf

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Randomized Trial of Platelet-Transfusion Thresholds in Neonates von Curley, Anna, Stanworth, Simon J, Willoughby, Karen, Fustolo-Gunnink, Susanna F, Venkatesh, Vidheya, Hudson, Cara, Deary, Alison, Hodge, Renate, Hopkins, Valerie, Lopez Santamaria, Beatriz, Mora, Ana, Llewelyn, Charlotte, D’Amore, Angela, Khan, Rizwan, Onland, Wes, Lopriore, Enrico, Fijnvandraat, Karin, New, Helen, Clarke, Paul, Watts, Timothy

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Clint: a novel clathrin-binding ENTH-domain protein at the Golgi von Kalthoff, Christoph, Groos, Stephanie, Kohl, Rüdiger, Mahrhold, Stefan, Ungewickell, Ernst J

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Titrieren digital oder analog – Lässt sich das experimentell‐praktische Verständnis von Studierenden gleichermaßen fördern? von Groos, Lukas, Kranz, David, Lieber, Leonie Sabine, Maaß, Kai, Graulich, Nicole

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Titration digital or analog – Is students′ experimental‐practical understanding be supported equally? von Groos, Lukas, Kranz, David, Lieber, Leonie Sabine, Maaß, Kai, Graulich, Nicole

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Preterm neonates benefit from low prophylactic platelet transfusion threshold despite varying risk of bleeding or death von Fustolo-Gunnink, Susanna F., Fijnvandraat, Karin, van Klaveren, David, Stanworth, Simon J., Curley, Anna, Onland, Wes, Steyerberg, Ewout W., de Kort, Ellen, d'Haens, Esther J., Hulzebos, Christian V., Huisman, Elise J., de Boode, Willem P., Lopriore, Enrico, van der Bom, Johanna G.

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Data Loam: Sometimes Hard, Usually Soft. The Future of Knowledge Systems von Paganelli, Mattia, Reinhart, Martin, Golding, Johnny

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From Naples 1963 to Rome 2013 — A brief review of how the International Research Group on Ostracoda (IRGO) developed as a social communication system von Danielopol, Dan L., Baltanás, Angel, Carbonel, Pierre, Colin, Jean-Paul, Crasquin, Sylvie, Decrouy, Laurent, De Deckker, Patrick, Gliozzi, Elsa, Groos-Uffenorde, Helga, Horne, David J., Iepure, Sanda, Keyser, Dietmar, Kornicker, Louis S., Lord, Alan, Martens, Koen, Matzke-Karasz, Renate, Giles Miller, C., Oertli, Henri J., Pugliese, Nevio, Russo, Antonio, Sames, Benjamin, Schön, Isa, Siveter, David J., Smith, Alison, Viehberg, Finn A., Wouters, Karel, Yassini, Iradj

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Theory and experimental validation of a new analytical model for the position-dependent Hall Voltage in devices with arbitrary aspect ratio von Rudan, M., Reggiani, S., Gnani, E., Baccarani, G., Corvasce, C., Barlini, D., Ciappa, M., Fichtner, W., Denison, M., Jensen, N., Groos, G., Stecher, M.

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(Invited) A Functional Analysis of MEA Attributes and Properties for the Quality Control of Polymer Electrolyte Fuel Cells von Yuan, Xiaozi, Nayoze-Coynel, Christine, Shaigan, Nima, Fischer, David, Zhao, Nana, Zamel, Nada, Gazdzicki, Pawel, Ulsh, Michael, Friedrich, K. Andreas, Girard, Francois, Groos, Ulf

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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES von LENOX, Chet, VON DEN HOFF, Mike, PRICE, David, W, DONZELLA, Oreste, ROBINSON, John, GROOS, Thomas, NARASIMHAN, Narayani, LIM, Teng, Song, LACH, Justin, SHERMAN, Kara, SAVILLE, Barry, RATHERT, Robert, J

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IMAGING REFLECTOMETRY FOR INLINE SCREENING von VON DEN HOFF, Mike, PRICE, David W, DONZELLA, Oreste, GROOS, Thomas, ROBINSON, John Charles, LENOX, Chet V, LACH, Justin, PANDEV, Stilian, SAVILLE, Barry, LI, Shifang, RATHERT, Robert J

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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES von LENOX, Chet, VON DEN HOFF, Mike, PRICE, David, W, DONZELLA, Oreste, ROBINSON, John, GROOS, Thomas, NARASIMHAN, Narayani, LIM, Teng, Song, LACH, Justin, SHERMAN, Kara, SAVILLE, Barry, RATHERT, Robert, J

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IMAGING REFLECTOMETRY FOR INLINE SCREENING von Groos, Thomas, Rathert, Robert J, Donzella, Oreste, Lach, Justin, Price, David W, Robinson, John Charles, Lenox, Chet V, Pandev, Stilian, Von Den Hoff, Mike, Saville, Barry, Li, Shifang

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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES von LENOX, Chet, VON DEN HOFF, Mike, LIM, Teng, DONZELLA, Oreste, ROBINSON, John, RATHERT, Robert, GROOS, Thomas, NARASIMHAN, Narayani, PRICE, David, LACH, Justin, SHERMAN, Kara, SAVILLE, Barry

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IMAGING REFLECTOMETRY FOR INLINE SCREENING von VON DEN HOFF, Mike, PRICE, David W, DONZELLA, Oreste, GROOS, Thomas, ROBINSON, John Charles, LENOX, Chet V, LACH, Justin, PANDEV, Stilian, SAVILLE, Barry, LI, Shifang, RATHERT, Robert J

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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES von Robinson, John, Groos, Thomas, Lim, Teng Song, Rathert, Robert J, Donzella, Oreste, Lach, Justin, Price, David W, Sherman, Kara L, Lenox, Chet V, Narasimhan, Narayani, Von Den Hoff, Mike, Saville, Barry

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Advanced in-line part average testing von Cappel, Robert, Groos, Thomas, Rathert, Robert J, Donzella, Oreste, Lim, Teng-Song, Price, David W, Hoff, Mike Von Den, Bhatti, Naema, Sutherland, Doug, Sherman, Kara L, Robinson, John Charles, Saville, Barry

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ADVANCED IN-LINE PART AVERAGE TESTING von VON DEN HOFF, Mike, PRICE, David W, LIM, Alex, DONZELLA, Oreste, SUTHERLAND, Doug, GROOS, Thomas, ROBINSON, John C, CAPPEL, Robert, SAVILLE, Barry, SHERMAN, Kara L, RATHERT, Robert J, BHATTI, Naema

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