Low-Dimensional Structures in Semiconductors: From Basic Physics to Applications von Peaker, A.R, Grimmeiss, H.G

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Low-Dimensional Structures in Semiconductors: From Basic Physics to Applications von Peaker, A. R, Grimmeiss, H. G

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Electrical characterization of SiGe heterostructure bipolar transistors von Engvall, J., Nagesh, V., Grimmeiss, H.G., Schreiber, H.-U., Kasper, E.

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Electrical and optical properties of GaP grown on Si by MOVPE von Samuelson, L., Omling, P., Grimmeiss, H.G.

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Sonoluminescence and acoustically driven optical phenomena in solids and solid–gas interfaces von Ostrovskii, I.V., Korotchenkov, O.A., Goto, T., Grimmeiss, H.G.

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Charge transfer state of novel molecular complex C26H18Te2·C60·CS2 detected in single crystals by photoluminescence and ESR von Steinman, E.A, Kveder, V.V, Konarev, D.V, Qin, Wang, Grimmeiss, H.G

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Charge transfer state of novel molecular complex C 26H 18Te 2·C 60·CS 2 detected in single crystals by photoluminescence and ESR von Steinman, E.A, Kveder, V.V, Konarev, D.V, Qin, Wang, Grimmeiss, H.G

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Alloy fluctuations in Si1−xGex crystals von Kocher, G., Jantsch, W., Abrosimov, N., Egorov, S., Zabrodskii, A., Andreev, B., Grimmeiss, H.G.

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Alloy fluctuations in Si 1− xGe x crystals von Kocher, G., Jantsch, W., Abrosimov, N., Egorov, S., Zabrodskii, A., Andreev, B., Grimmeiss, H.G.

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Electron capture properties of multi-DX levels in Si doped AlGaAs von Jia, Y.B., Grimmeiss, H.G.

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Optical characterization of deep energy levels in semiconductors von Monemar, B., Grimmeiss, H.G.

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Preface von Müssig, H.-J., Marletta, G., Grimmeiss, H.G., Solórzano, G., Fan, S.

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PII: S0928-4931(06)00273-6 von Müssig, H.-J., Marletta, G., Grimmeiss, H.G., Solórzano, G., Fan, S.

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p-n-junction photovoltaic effect in zinc-doped GaP von Grimmeiss, H.G., Kischio, W., Koelmans, H.

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Efficiency of recombination radiation in GaP von Grimmeiss, H.G., Scholz, H.

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Electrical and optical defect spectroscopy of compound semiconductors von Grimmeiss, H.G., Kleverman, M.

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Optical and electrical characterization of Si/Ge superlattices von Grimmeiss, H.G., Nagesh, V., Engvall, J., Olajos, J., Presting, H., Kibbel, H., Kasper, E.

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EPR identification of a trigonal FeIn defect in silicon von Omling, P., Emanuelsson, P., Gehlhoff, W., Grimmeiss, H.G.

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SiGe: A Promise into Reality? von Grimmeiss, H.G., Olajos, J., Engval, J.

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Photocapacitance studies of short-period Si/Ge superlattices von Nagesh, V., Grimmeiss, H.G., Presting, H., Kibbel, H., Kasper, E.

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