Surface analysis of Nb materials for SRF cavities von Maheshwari, P., Tian, H., Reece, C. E., Kelley, M. J., Myneni, G. R., Stevie, F. A., Rigsbee, J. M., Batchelor, A. D., Griffis, D. P.

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Quantification in dynamic SIMS: Current status and future needs von Stevie, F.A., Griffis, D.P.

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Etching characteristics of chromium thin films by an electron beam induced surface reaction von Wang, Jianhua, Griffis, D P, Garcia, R, Russell, P E

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SIMS analysis of zinc oxide LED structures: quantification and analysis issues von Stevie, F. A., Maheshwari, P., Pierce, J. M., Adekore, B. T., Griffis, D. P.

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SIMS analysis of high-performance accelerator niobium von Maheshwari, P., Stevie, F. A., Myneni, G. R., Ciovati, G., Rigsbee, J. M., Dhakal, P., Griffis, D. P.

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Optimization of secondary ion mass spectrometry detection limit for N in SiC von Pivovarov, A. L., Stevie, F. A., Griffis, D. P., Guryanov, G. M.

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Chemically enhanced focused ion beam micromachining of copper von Gonzalez, J. C., Griffis, D. P., Miau, T. T., Russell, P. E.

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Channeling effects during focused-ion-beam micromachining of copper von Phillips, J. R., Griffis, D. P., Russell, P. E.

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Circuit editing of copper and low‐k dielectrics in nanotechnology devices von MOSSELVELD, F., MAKAROV, V. V., LUNDQUIST, T. R., GRIFFIS, D. P., RUSSELL, P. E.

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SIMS quantification of matrix and impurity species in AlxGa1-xN von GU, C. J, STEVIE, F. A, HITZMAN, C. J, SARIPALLI, Y. N, JOHNSON, M, GRIFFIS, D. P

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Back side SIMS analysis of hafnium silicate von Gu, C., Stevie, F.A., Bennett, J., Garcia, R., Griffis, D.P.

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Improved charge neutralization method for depth profiling of bulk insulators using O 2+ primary beam on a magnetic sector SIMS instrument von Pivovarov, A.L., Stevie, F.A., Griffis, D.P.

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TEM and SIMS Analysis of (100), (110), and (111) Single Crystal Niobium von Batchelor, A D, Leonard, D N, Russell, P E, Stevie, F A, Griffis, D P, Myneni, G R

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Quantification of cesium surface contamination on silicon resulting from SIMS analysis von Penley, C., Stevie, F. A., Griffis, D. P.

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Discrimination between adsorption and coprecipitation in aquatic particle standards by surface analysis techniques: lead distributions in calcium carbonates von Fulghum, Julia E, Bryan, Scott R, Linton, Richard W, Bauer, Christopher F, Griffis, Dieter P

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Improvements in focused ion beam micromachining of interconnect materials von Gonzalez, J. C., da Silva, M. I. N., Griffis, D. P., Russell, P. E.

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Secondary ion mass spectrometry characterization of anomalous behavior for low dose ion implanted phosphorus in silicon von Penley, C., Stevie, F. A., Griffis, D. P., Siebel, S., Kulig, L., Lee, J.

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Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam von Zhu, Zhengmao, Stevie, Frederick A., Griffis, Dieter P.

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Improved understanding of an electron beam charge compensation method for magnetic sector secondary ion mass spectrometer analysis of insulators von Zhu, Z., Gu, C., Stevie, F. A., Griffis, D. P.

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SIMS quantification of matrix and impurity species in Al x Ga 1− x N von Gu, C.J., Stevie, F.A., Hitzman, C.J., Saripalli, Y.N., Johnson, M., Griffis, D.P.

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