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Atomic force microscopy and X-ray diffraction study of surface and interface roughness in Nb/Cu multilayers von Temst, K., Van Bael, M.J., de Groot, D.G., Koeman, N.J., Griessen, R.P., Wuyts, B., Van Haesendonck, C., Bruynseraede, Y.

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Properties of Bi-Sr-Ca-Cu oxide films produced by laser ablation deposition von Van Veen, G.N.A., Van Ingen, R.P., Baller, T.S., Aarts, J., Shu-Quan, Guo, Flipse, C.F.J., Lensink, J.G., Hagen, C.W., Griessen, R.

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