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  1. 1
    Characterizing industrial catalysts using in situ XAFS under identical conditions

    Characterizing industrial catalysts using in situ XAFS under identical conditions von Bare, Simon R, Kelly, Shelly D, Ravel, Bruce, Greenlay, Nan, King, Lisa, Mickelson, George E


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    Characterizing industrial catalysts using in situ XAFS under identical conditionsThis article was submitted as part of a Themed Issue on recent developments in X-ray absorption spectroscopy. Other papers on this topic can be found in issue 21 of vol. 12 (2010). This issue can be found from the PCCP homepage [http://www.rsc.org/pccp]Electronic supplementary information (ESI) available: Figs. S1-S3. See DOI: 10.1039/b926621f

    Characterizing industrial catalysts using in situ XAFS under identical conditionsThis article was submitted as part of a Themed Issue on recent developments in X-ray absorption spe... von Bare, Simon R, Kelly, Shelly D, Ravel, Bruce, Greenlay, Nan, King, Lisa, Mickelson, George E


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    Solid material characterization with X-ray spectra in both transmission and fluoresence modes

    Solid material characterization with X-ray spectra in both transmission and fluoresence modes von GREENLAY NAN, KELLY SHELLY D, BARE SIMON RUSSELL, SINKLER WHARTON

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