Single event effects in PDSOI 4 M SRAM fabricated in UNIBOND von Liu, S.T., Heikkila, W.W., Golke, K.W., Anthony, D., Hurst, A., Kirchner, G., Jenkins, W.C., Hughes, H.L., Mitra, S., Ioannou, D.E.

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Limiting Upset Cross Sections of SEU Hardened SOI SRAMs von Liu, M.S., Liu, H.Y., Brewster, N., Nelson, D., Golke, K.W., Kirchner, G., Hughes, H.L., Campbell, A., Ziegler, J.F.

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Determination of funnel length from cross section versus LET measurements von Golke, K.W.

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A new dose rate model for SOI MOSFETs and its implementation in SPICE von Liu, H.Y., Golke, K.W., Liu, S.T.

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