The measurement of electrical properties of nanostructures with use of conductive diamond tip von Soshnikov, A I, Gogolinsky, K V, Blank, V D, Reshetov, V N

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Mechanical, structural, and spectroscopic properties of C70 fullerite phases produced under high pressure and shear von Blank, V. D., Gogolinsky, K. V., Denisov, V. N., Ivdenko, V. A., Mavrin, B. N., Serebryanaya, N. R., Sulyanov, S. N.

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Ultrahard and superhard phases of fullerite C 60: Comparison with diamond on hardness and wear von Blank, V., Popov, M., Pivovarov, G., Lvova, N., Gogolinsky, K., Reshetov, V.

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Nano-sclerometry measurements of superhard materials and diamond hardness using scanning force microscope with the ultrahard fullerite C60 tip von Blank, V., Popov, M., Lvova, N., Gogolinsky, K., Reshetov, V.

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Ultrahard and superhard phases of fullerite C60: Comparison with diamond on hardness and wear von Blank, V., Popov, M., Pivovarov, G., Lvova, N., Gogolinsky, K., Reshetov, V.

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Nano-sclerometry measurements of superhard materials and diamond hardness using scanning force microscope with the ultrahard fullerite C 60 tip von Blank, V., Popov, M., Lvova, N., Gogolinsky, K., Reshetov, V.

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The investigation of crack propagation in cleavage directions on the surface of SiC by sclerometry von Soshnikov, A., Gogolinsky, K., Blank, V.

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