Model-based SEM for dimensional metrology tasks in semiconductor and mask industry von Frase, C G, Gnieser, D, Bosse, H

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Characterization of nanoparticles by scanning electron microscopy in transmission mode von Buhr, E, Senftleben, N, Klein, T, Bergmann, D, Gnieser, D, Frase, C G, Bosse, H

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Model-based SEM for dimensional metrology tasks in semiconductor and mask industry von Frase, C G, Gnieser, D, Bosse, H

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Electron permeable membranes for MEMS electron sources von Haase, F., Detemple, P., Schmitt, S., Lendle, A., Haverbeck, O., Doll, T., Gnieser, D., Bosse, H., Frase, G.

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The MEGAPIE-TEST project: Supporting research and lessons learned in first-of-a-kind spallation target technology von Fazio, C., Gröschel, F., Wagner, W., Thomsen, K., Smith, B.L., Stieglitz, R., Zanini, L., Guertin, A., Cadiou, A., Henry, J., Agostini, P., Dai, Y., Heyck, H., Dementjev, S., Panebianco, S., Almazouzi, A., Eikenberg, J., Letourneau, A., Toussaint, J.C., Janett, A., Perret, Ch, Joray, S., Patorski, J., Leung, W., Meloni, P., Turroni, P., Zucchini, A., Benamati, G., Konys, J., Auger, T., Gessi, A., Gorse, D., Serre, I., Terlain, A., Vogt, J.-B., Batta, A., Class, A., Cheng, X., Fellmoser, F., Daubner, M., Gnieser, S., Grötzbach, G., Milenkovic, R., Latgé, C., Knebel, J.U.

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Process for treating and disposing of sewage sludges of a region von GNIESER, JUERGEN., 06132 HALLE, DE

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DE2603798 von MOERGELI, BENJAMIN. DR., RICKENBACH, GINOCCHIO, JULIO., STAEFA, GNIESER, JUERGEN, WEINFELDEN

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