Use of combined linear and nonlinear formalisms applied to the transport of protons and secondary electrons in a Monte Carlo code: Applications for space missions von Caron, P., Inguimbert, C., Gibaru, Q., Pinson, M.

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Geant4 physics processes for microdosimetry and secondary electron emission simulation: Extension of MicroElec to very low energies and 11 materials (C, Al, Si, Ti, Ni, Cu, Ge, Ag,... von Gibaru, Q., Inguimbert, C., Caron, P., Raine, M., Lambert, D., Puech, J.

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Monte-Carlo simulation and analytical expressions for the extrapolated range and transmission rate of low energy electrons [10 eV–10 keV] in 11 monoatomic materials von Gibaru, Q., Inguimbert, C., Belhaj, M., Raine, M., Lambert, D.

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Monte-Carlo simulation and experimental study of the effect of internal charging on the electron emission yield of amorphous SiO2 thin films von Gibaru, Q., Inguimbert, C., Belhaj, M., Raine, M., Lambert, D.

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Surface ionizing dose deposited by low energy electrons (10 eV–10 keV) in eleven monoatomic materials: Monte Carlo calculations and analytical expressions von Gibaru, Q., Inguimbert, C., Caron, P., Belhaj, M., Raine, M., Lambert, D.

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Modelling the impact on the secondary electron yield of carbon layers of various thicknesses on copper substrate von Inguimbert, C., Gibaru, Q., Caron, P., Angelucci, M., Spallino, L., Cimino, R.

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Experimental and Monte-Carlo study of double-hump electron emission yield curves of SiO2 thin films von Gibaru, Q., Inguimbert, C., Belhaj, M., Dadouch, S., Raine, M., Lambert, D., Payan, D.

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