Surface roughness studies for wind tunnel models used in high Reynolds number testing von Vorburger, T. V, McLay, M. J, Scire, F. E, Gilsinn, D. E, Giauque, C. H. W, Teague, E. C

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Stylus-laser surface calibration system von Vorburger, T.V., Song, J.F., Giauque, C.H.W., Renegar, T.B., Whitenton, E.P., Croarkin, M.C.

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Optical measurement of the roughness of sinusoidal surfaces von Vorburger, T.V., Gilsinn, D.E., Scire, F.E., McLay, M.J., Giauque, C.H.W., Teague, E.C.

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Wind tunnel model surface gauge for measuring roughness von Vorburger, T. V., Gilsinn, D. E., Teague, E. C., Giauque, C. H. W., Scire, F. E., Cao, L. X.

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X-ray microprobe using multilayer mirrors von Underwood, J.H., Thompson, A.C., Wu, Y., Giauque, R.D.

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Measurement of femtogram quantities of trace elements using an x-ray microprobe von Giauque, Robert D, Thompson, Albert C, Underwood, James H, Wu, Yan, Jones, Keith W, Rivers, Mark L

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Analysis of fluid inclusions by X-ray fluorescence using synchrotron radiation von Frantz, John D., Mao, H.K., Zhang, Yi-Gang, Wu, Y., Thompson, A.C., Underwood, J.H., Giauque, R.D., Jones, K.W., Rivers, M.L.

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Elemental measurements with an X-ray microprobe of biological and geological samples with femtogram sensitivity von Thompson, A.C., Underwood, J.H., Wu, Y., Giauque, R.D., Jones, K.W., Rivers, M.L.

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A tunable X-ray microprobe using synchrotron radiation von Wu, Y., Thompson, A.C., Underwood, J.H., Giauque, R.D., Chapman, K., Rivers, M.L., Jones, K.W.

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