2.2μm画素の積層型裏面入射Voltage-domainグローバルシャッタCMOSイメージセンサ von Keiji MABUCHI, Geunsook PARK, Alan Chih-Wei HSUING, Jingming YAO, Zhiqiang LIN, Vincent C. VENEZIA, Tongtong YU, Yu-Shen YANG, Tiejun DAI, Lindsay A. GRANT

Volltext

A Nano-Structure Memory with Silicon on Insulator Edge Channel and a Nano Dot von Park, Geunsook, Hwang, SangyeonHan, Shin, Hyungcheol

Volltext

Data readout with active reset feedback amplifier for stacked image sensor von Hsiung, Chih-Wei, Park, Geunsook

Volltext bestellen

A 2.2um three-wafer stacked back side illuminated voltage domain global shutter CMOS image sensor von Fukuoka, Shimpei, Uchiyama, Masayuki, Park, Geunsook, Hsiung, Alan Chih-Wei, Daoudi, Mourad, Lin, Zhiqiang, Venezia, Vincent C., Grant, Lindsay A.

Volltext

A 40/22nm 200MP Stacked CMOS Image Sensor with 0.61μm Pixel von Masayuki Uchiyama, Geunsook Park, Sangjoo Lee, Tomoyasu Tate, Masashi Minagawa, Shino Shimoyamada, Zhiqiang Lin, King W. Yeung, Lien Tu, Wu-Zang Yang, Alan Chih-Wei Hsiung, Vincent C. Venezia, Lindsay A. Grant

Volltext

Negatively biased isolation structures for pixel devices von Watanabe, Kazufumi, Hsiung, Chih-Wei, Grant, Lindsay Alexander, Jung, Young Woo, Park, Geunsook, Venezia, Vincent

Volltext bestellen

PIXEL CELL OF IMAGE SENSOR, IMAGING SYSTEM AND METHOD OF READING IMAGE SIGNAL von PARK, GEUNSOOK, HSIUNG, CHIH-WEI

Volltext bestellen

A 64M CMOS Image Sensor using 0.7um pixel with high FWC and switchable conversion gain von Y. Jay Jung, Vincent C. Venezia, Sangjoo Lee, Chun Yung Ai, Yibo Zhu, King W. Yeung, Geunsook Park, Woonil Choi, Zhiqiang Lin, Wu-Zang Yang, Alan Chih-Wei Hsiung, Lindsay A. Grant

Volltext

NEGATIVELY BIASED ISOLATION STRUCTURES FOR PIXEL DEVICES von Watanabe, Kazufumi, Hsiung, Chih-Wei, Grant, Lindsay Alexander, Jung, Young Woo, Park, Geunsook, Venezia, Vincent

Volltext bestellen

A Nano-Structure Memory With SOI Edge Channel And A Nano Dot von Geunsook Park, Sangyeon Han, Hyungcheol Shin

Volltext bestellen

IMAGE SENSOR, METHOD FOR MANUFACTURING THE SAME, AND PIXEL DEVICE von VENEZIA, VINCENT, PARK, GEUNSOOK, WATANABE, KAZUFUMI, HSIUNG, CHIH-WEI, GRANT, LINDSAY ALEXANDER, JUNG, YOUNG WOO

Volltext bestellen

Plasma charging damage during over-etch time of aluminum von Shin, Hyungcheol, Park, Geunsook, Hu, Chenming

Volltext

NEGATIVELY BIASED ISOLATION STRUCTURES FOR PIXEL DEVICES von WATANABE KAZUFUMI, HSIUNG CHIH-WEI, GRANT LINDSAY ALEXANDER, VENEZIA VINCENT, JUNG YOUNG WOO, PARK GEUNSOOK

Volltext bestellen