Transmission EBSD from 10 nm domains in a scanning electron microscope von KELLER, R.R., GEISS, R.H.

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Elastic-property measurements of ultrathin films using atomic force acoustic microscopy von Kopycinska-Müller, M, Geiss, R H, Müller, J, Hurley, D C

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Nanoscale elastic-property measurements and mapping using atomic force acoustic microscopy methods von Hurley, D C, Kopycinska-Müller, M, Kos, A B, Geiss, R H

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Resistivity dominated by surface scattering in sub-50 nm Cu wires von Graham, R. L., Alers, G. B., Mountsier, T., Shamma, N., Dhuey, S., Cabrini, S., Geiss, R. H., Read, D. T., Peddeti, S.

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Quantitative Elastic-Property Measurements at the Nanoscale with Atomic Force Acoustic Microscopy von Hurley, D. C., Kopycinska-Müller, M., Kos, A. B., Geiss, R. H.

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Strain-induced grain growth during rapid thermal cycling of aluminum interconnects von KELLER, R. R, GEISS, R. H, BARBOSA, N, SLIFKA, A. J, READ, D. T

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EBSD measurement of strains in GaAs due to oxidation of buried AlGaAs layers von Keller, R.R, Roshko, A, Geiss, R.H, Bertness, K.A, Quinn, T.P

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Comparison of electrical and microtensile evaluations of mechanical properties of an aluminum film von BARBOSA, N, KELLER, R. R, READ, D. T, GEISS, R. H, VINCI, R. P

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Anisotropic elastic properties of nanocrystalline nickel thin films von Hurley, D.C., Geiss, R.H., Kopycinska-Müller, M., Müller, J., Read, D.T., Wright, J.E., Jennett, N.M., Maxwell, A.S.

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Chemical contamination at the head-disk interface in a disk drive von Fowler, D.E., Geiss, R.H.

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Characterization of InGaN quantum disks in GaN nanowires von Roshko, A., Geiss, R. H., Schlager, J. B., Brubaker, M. D., Bertness, K. A., Sanford, N. A., Harvey, T. E.

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Constraint effect in deformation of copper interconnect lines subjected to cyclic Joule heating von Read, D T, Geiss, R H, Barbosa, N

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Observation of slider droplet formation during fly stiction tests with a real time visualization instrument von Fowler, D.E., Geiss, R.H., Eldridge, D., Schreck, E.

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Analytical electron microscopy of thin films and interfaces von Geiss, R.H.

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Micromagnetics of magnetization reversal in amorphous Tb-Fe films by Lorentz microscopy von LIN, C.-J, SUIT, J. C, GEISS, R. H

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Lorentz microscopy of micron-sized laser-written magnetic domains in TbFe von SUITS, J. C, GEISS, R. H, LIN, C. J, RUGAR, D, BELL, A. E

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Observation of laser-written magnetic domains in amorphous TbFe films by Lorentz microscopy von SUITS, J. C, GEISS, R. H, LIN, C. J, RUGAR, D, BELL, A. E

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Imaging of the grain-to-grain epitaxy in NiFe/FeMn thin-film couples von CHERNGYE HWANG, GEISS, R. H, HOWARD, J. K

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New Measurements on the Minimum and Maximum Sample Sizes in t-EBSD von Geiss, R.H., Rice, K.P., Keller, R.R.

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Defect behavior in aluminum interconnect lines deformed thermomechanically by cyclic joule heating von Geiss, Roy H., Read, David T.

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