Sub-ppm/°C Bandgap References With Natural Basis Expansion for Curvature Cancellation von Liu, Nanqi, Geiger, Randall L., Chen, Degang

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USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test von Chen, Tao, Jin, Xiankun, Geiger, Randall L., Chen, Degang

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A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test von Chen, Tao, Park, Chulhyun, Meng, Hao, Zhou, Dadian, Silva-Martinez, Jose, Geiger, Randall L., Chen, Degang

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Soft Elastomeric Capacitor Network for Strain Sensing Over Large Surfaces von Laflamme, Simon, Saleem, Hussam S., Vasan, Bharath K., Geiger, Randall L., Degang Chen, Kessler, Michael R., Rajan, Krishna

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A 12-Bit 125-MS/s 2.5-Bit/Cycle SAR-Based Pipeline ADC Employing a Self-Biased Gain Boosting Amplifier von Park, Chulhyun, Chen, Tao, Noh, Kyoohyun, Zhou, Dadian, Prakash, Suraj, Alizadeh, Mohammadhossein Naderi, Karsilayan, Aydin I., Chen, Degang, Geiger, Randall L., Silva-Martinez, Jose

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An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method von Chen, Tao, Park, Chulhyun, Chaganti, Shravan K., Silva-Martinez, Jose, Geiger, Randall L., Chen, Degang

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Low-Distortion Sine Wave Generation Using a Novel Harmonic Cancellation Technique von Vasan, Bharath Karthik, Sudani, Siva Kumar, Chen, Degang J., Geiger, Randall L.

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Biphasic DC measurement approach for enhanced measurement stability and multi-channel sampling of self-sensing multi-functional structural materials doped with carbon-based additiv... von Downey, Austin, D'Alessandro, Antonella, Ubertini, Filippo, Laflamme, Simon, Geiger, Randall

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Analyses of Static and Dynamic Random Offset Voltages in Dynamic Comparators von Jun He, Sanyi Zhan, Degang Chen, Geiger, R.L.

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Linearity Test of Analog-to-Digital Converters Using Kalman Filtering von Le Jin, Degang Chen, Randall Geiger

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A 1.5-V 14-bit 100-MS/s self-calibrated DAC von Yonghua Cong, Geiger, R.L.

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Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal von Jin, L., Parthasarathy, K., Kuyel, T., Degang Chen, Geiger, R.L.

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An automatic offset compensation scheme with ping-pong control for CMOS operational amplifiers von Chong-Gun Yu, Geiger, R.L.

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Static characterization of a soft elastomeric capacitor for non destructive evaluation applications von Saleem Hussam, Laflamme, Simon, Zhang Huanhuan, Geiger, Randall, Kessler, Michael, Rajan, Krishna

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Practical methods for verifying removal of Trojan stable operating points von Yen-Ting Wang, Degang Chen, Geiger, Randall L.

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On Chip Signal Generators for Low Overhead ADC BIST von Duan, Jingbo, Vasan, Bharath, Zhao, Chen, Chen, Degang, Geiger, Randall

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Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal von Le Jin, Degang Chen, Geiger, R.L.

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SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving von Le Jin, Degang Chen, Geiger, R.L.

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Effectiveness of circuit-level continuation methods for Trojan State Elimination verification von Yen-Ting Wang, Chen, Degang J., Geiger, Randall L.

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Testing of Precision DAC Using Low-Resolution ADC With Wobbling von Le Jin, Haggag, H., Geiger, R.L., Degang Chen

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