The impact of chronic blood–brain barrier breach on intracortical electrode function von Saxena, Tarun, Karumbaiah, Lohitash, Gaupp, Eric A, Patkar, Radhika, Patil, Ketki, Betancur, Martha, Stanley, Garrett B, Bellamkonda, Ravi V

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Interface-induced room-temperature multiferroicity in BaTiO3 von Valencia, S., Crassous, A., Bocher, L., Garcia, V., Moya, X., Cherifi, R. O., Deranlot, C., Bouzehouane, K., Fusil, S., Zobelli, A., Gloter, A., Mathur, N. D., Gaupp, A., Abrudan, R., Radu, F., Barthélémy, A., Bibes, M.

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At-wavelength metrology facility for soft X-ray reflection optics von Sokolov, A., Bischoff, P., Eggenstein, F., Erko, A., Gaupp, A., Künstner, S., Mast, M., Schmidt, J.-S., Senf, F., Siewert, F., Zeschke, Th, Schäfers, F.

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Efficient high‐order suppression system for a metrology beamline von Sokolov, A., Sertsu, M. G., Gaupp, A., Lüttecke, M., Schäfers, F.

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The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-II von Schäfers, F., Bischoff, P., Eggenstein, F., Erko, A., Gaupp, A., Künstner, S., Mast, M., Schmidt, J.-S., Senf, F., Siewert, F., Sokolov, A., Zeschke, Th

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The identification and characterisation of carbonaceous interface layers of graphene using polarisation-dependent X-ray reflectometry von Wahab, H., Jansing, C., Mertins, H.-Ch, Kim, J.H., Choi, S.-H., Gaupp, A., Timmers, H.

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Relationship between intracortical electrode design and chronic recording function von Karumbaiah, Lohitash, Saxena, Tarun, Carlson, David, Patil, Ketki, Patkar, Radhika, Gaupp, Eric A, Betancur, Martha, Stanley, Garrett B, Carin, Lawrence, Bellamkonda, Ravi V

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Soft X‐ray refractive index by reconciling total electron yield with specular reflection: experimental determination of the optical constants of graphite von Jansing, C., Wahab, H., Timmers, H., Gaupp, A., Mertins, H.-C.

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Quadratic X-ray magneto-optical effect upon reflection in a near-normal-incidence configuration at the M edges of 3d-transition metals von Valencia, S, Kleibert, A, Gaupp, A, Rusz, J, Legut, D, Bansmann, J, Gudat, W, Oppeneer, P M

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Short period, high field cryogenic undulator for extreme performance x-ray free electron lasers von O’Shea, F. H., Marcus, G., Rosenzweig, J. B., Scheer, M., Bahrdt, J., Weingartner, R., Gaupp, A., Grüner, F.

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Faraday rotation spectra at shallow core levels: 3p edges of Fe, Co, and Ni von Valencia, S, Gaupp, A, Gudat, W, Mertins, H-Ch, Oppeneer, P M, Abramsohn, D, Schneider, C M

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Diversity and Otherness: Transcultural Insights into Norms, Practices, Negotiations von Lisa Gaupp, Giulia Pelillo-Hestermeyer, Lisa Gaupp, Giulia Pelillo-Hestermeyer

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Polarization properties of Mo/Si multilayers in the EUV range von Uschakow, S., Gaupp, A., Gerhard, M., MacDonald, M., Schäfers, F.

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First spectral measurements of a cryogenic high-field short-period undulator von Holy, F., Maier, A. R., Zeitler, B., Weingartner, R., Raith, S., Kajumba, N., Ghazaly, M. El, Lauth, W., Krambrich, D., Gaupp, A., Scheer, M., Bahrdt, J., Grüner, F.

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A reflectometer for at-wavelength characterisation of gratings von Eggenstein, F., Schäfers, F., Erko, A., Follath, R., Gaupp, A., Löchel, B., Senf, F., Zeschke, T.

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X-ray natural linear dichroism of graphitic materials across the carbon K-edge: Correction for perturbing high-order harmonics von Jansing, C, Mertins, H C, Gaupp, A, Sokolov, A, Gilbert, M C, Wahab, H, Timmers, H

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Influence of the crystal structure of thin Co films on X-ray magnetic linear dichroism—Comparison of ab initio theory and reflectometry experiments von Legut, D., Tesch, M. F., Mertins, H.-Ch, Gilbert, M. C., Jansing, C., Bürgler, D. E., Schneider, C. M., Gaupp, A., Hamrle, J., Oppeneer, P. M.

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Magneto-optical reflection spectroscopy on graphene/Co in the soft x-ray range von Mertins, H.-Ch, Jansing, C., Gilbert, M., Krivenkov, M., Sanchez-Barriga, J., Varykhalov, A., Rader, O., Wahab, H., Timmers, H., Gaupp, A., Tesch, M., Sokolov, A., Legut, D., Oppeneer, P M.

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EUV Ellipsometry on Mo/Si Multilayers von Uschakow, S, Gaupp, A, MacDonald, M, Schäfers, F

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Giant magneto-optical Faraday effect of graphene on Co in the soft x-ray range von Mertins, H.-Ch, Jansing, C., Krivenkov, M., Varykhalov, A., Rader, O., Wahab, H., Timmers, H., Gaupp, A., Sokolov, A., Tesch, M., Oppeneer, P. M.

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