Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping von Garming, Mathijs W. H, Bolhuis, Maarten, Conesa-Boj, Sonia, Kruit, Pieter, Hoogenboom, Jacob P

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Imaging resonant micro-cantilever movement with ultrafast scanning electron microscopy von Garming, Mathijs W. H., Kruit, Pieter, Hoogenboom, Jacob P.

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Beam displacement and blur caused by fast electron beam deflection von Zhang, Lixin, Garming, Mathijs W.H., Hoogenboom, Jacob P., Kruit, Pieter

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Time-resolved cathodoluminescence microscopy with sub-nanosecond beam blanking for direct evaluation of the local density of states von Moerland, Robert J, Weppelman, I Gerward C, Garming, Mathijs W H, Kruit, Pieter, Hoogenboom, Jacob P

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Nanoparticle discrimination based on wavelength and lifetime-multiplexed cathodoluminescence microscopy von Garming, Mathijs W. H, Weppelman, I. Gerward C, de Boer, Pascal, Martínez, Felipe Perona, Schirhagl, Romana, Hoogenboom, Jacob P, Moerland, Robert J

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Ultrafast scanning electron microscopy with sub-micrometer optical pump resolution von Garming, Mathijs W. H., Weppelman, I. Gerward C., Lee, Martin, Stavenga, Thijs, Hoogenboom, Jacob P.

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Ultrafast Laser-Pump Electron-Probe Microscopy for Imaging Semiconductor Carrier Dynamics von Garming, Mathijs W.H., Weppelman, I.G. (Gerward) C., Kruit, Pieter, Hoogenboom, Jacob P.

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LEEM BASED SURFACE PROFILE DETERMINATION von KRECINIC, Faruk, COENE, Willem, VAN RENS, Jasper, GARMING, Mathijs, KOOIMAN, Marleen

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ELECTRICAL CONNECTION TESTING von GAURY, Benoit, DE POORTERE, Etienne, HUISMAN, Thomas, GARMING, Mathijs

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Data underlying the publication: Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping von Garming, Mathijs, Bolhuis, Maarten, Conesa-Boj, Sonia, Kruit, Pieter, Hoogenboom, J. P. (Jacob)

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Data underlying the publication: Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping von Garming, Mathijs, Bolhuis, Maarten, Conesa-Boj, Sonia, Kruit, Pieter, Hoogenboom, J. P. (Jacob)

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Electrical connection testing von DE POORTERE, ETIENNE PIERRE L, HUISMAN, THOMAS JARIK, GARMING, MATHIJS WOUTER HENK, GAURY, BENOIT HERVE

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