RTS capture kinetics and Coulomb blockade energy in submicron nMOSFETs under surface quantization conditions von Lukyanchikova, N.B., Petrichuk, M.V., Garbar, N.P., Simoen, E., Claeys, C.

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A study of noise in surface and buried channel SiGe MOSFETs with gate oxide grown by low temperature plasma anodization von Lukyanchikova, N.B, Petrichuk, M.V, Garbar, N.P, Riley, L.S, Hall, S

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Excess white noise in bipolar junction transistors von Lukyanchikova, N.B., Garbar, N.P., Petrichuk, M.V.

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Hopping Conduction in Structures with Ge Nanoclusters Grown on Oxidized Si (001) von Kozyrev, Yurii N., Gomeniuk, Y.V., Kudina, Valeriya N., Garbar, Nikolay, Lysenko, Vladimir, Kondratenko, Sergey, Melnichuk, Yevgenij Ye

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Study of degradation of diode structures by the use of probes von Lukyanchikova, N. B., Garbar, N. P., Lisyanskii, M. I.

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Non-trivial GR and 1/ f noise generated in the p-Si layer of SOI and SOS MOSFETs near the inverted front or buried p-Si/SiO 2 interface von Lukyanchikova, N B, Petrichuk, M V, Garbar, N P, Simoen, E, Claeys, C

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Single Defect Studies by Means of Random Telegraph Signals in Submicron Silicon MOSFETs von Simoen, Eddy, Lukyanchikova, N.B., Petrichuk, M.V., Garbar, N.P., Claeys, Cor

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Noise in p-channel SiGe and Si MOSFETs with gate oxide grown by low temperature plasma anodisation von Lukyanchikova, N.B., Petrichuk, M.V., Garbar, N.P., Riley, L.S., Hall, S.

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Study of degradation of diode structures by the use of probes von Lukyanchikova, N. B., Garbar, N. P., Lisyanskii, M. I.

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Noise characterization of AlGaAs/GaAs HBTs with different emitter contacts von Lukyanchikova, N.B., Garbar, N.P., Petrichuk, M.V., Rezazadeh, A.A., Bashar, S.A.

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Identification of CD245 as myosin 18A, a receptor for surfactant A: A novel pathway for activating human NK lymphocytes von De Masson, A., Giustiniani, J., Marie-Cardine, A., Bouaziz, J. D., Dulphy, N., Gossot, D., Validire, P., Tazi, A., Garbar, C., Bagot, M., Merrouche, Y., Bensussan, A.

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Cardiac Troponins I and T Are Biological Markers of Left Ventricular Dysfunction in Septic Shock von ver Elst, Kristien M, Spapen, Herbert D, Nguyen, Duc Nam, Garbar, Christian, Huyghens, Luc P, Gorus, Frans K

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1/f noise and generation/recombination noise in SiGe HBTs on SOI von Lukyanchikova, N., Garbar, N., Smolanka, A., Lokshin, M., Hall, S., Buiu, O., Mitrovic, I.Z., Mubarek, H.A.W.E., Ashburn, P.

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Antigens and granularity of blood monocytes in relation to inflammatory markers and lipids in postmenopausal women von Zouaoui Boudjeltia, K., Gregoir, C., Guillaume, M., Remacle, C., Piro, P., Garbar, C., Ducobu, J., Moguilevsky, N., Vanhaeverbeek, M., Delree, P., Brohee, D.

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The base current and related 1/ f noise for SiGe HBTs realized by SEG/NSEG technology on SOI and bulk substrates von Lukyanchikova, N., Garbar, N., Smolanka, A., Lokshin, M., Hall, S., Buiu, O., Mitrovic, I.Z., El Mubarek, H.A.W., Ashburn, P.

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The influence of BF/sub 2/ and F implants on the 1/f noise in SiGe HBTs with a self-aligned link base von Lukyanchikova, N., Garbar, N., Petrichuk, M., Schiz, J.F.W., Ashburn, P.

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The influence of BF2 and F implants on the 1/f noise in SiGe HBTs with a self-aligned link base von Lukyanchikova, N, Garbar, N, Petrichuk, M, Schiz, J.F.W, Ashburn, P

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The influence of BF sub(2) and F implants on the 1/f noise in SiGe HBTs with a self-aligned link base von Lukyanchikova, Nataliya, Garbar, Nikolay, Petrichuk, Michail, Schiz, Jochen F W, Ashburn, Peter

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Identification of isolation-edge related random telegraph signals in submicron silicon metal–oxide–semiconductor field-effect transistors von Lukyanchikova, N., Petrichuk, M. V., Garbar, N., Simoen, E., Claeys, C.

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Electron valence band tunnelling induced excess Lorentzian noise in fully depleted SOI transistors von Simoen, E., Mercha, A., Claeys, C., Lukyanchikova, N.B., Garhar, N.

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