Quantitative determination of elemental diffusion from deeply buried layers by photoelectron spectroscopy von Zborowski, C., Renault, O., Torres, A., Guedj, C., Yamashita, Y., Ueda, S., Grenet, G., Tougaard, S.

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Cognitive enrichment through art: a randomized controlled trial on the effect of music or visual arts group practice on cognitive and brain development of young children von James, C E, Tingaud, M, Laera, G, Guedj, C, Zuber, S, Diambrini Palazzo, R, Vukovic, S, Richiardi, J, Kliegel, M, Marie, D

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Correction: Cognitive enrichment through art: a randomized controlled trial on the effect of music or visual arts group practice on cognitive and brain development of young childre... von James, C E, Tingaud, M, Laera, G, Guedj, C, Zuber, S, Palazzi, R Diambrini, Vukovic, S, Richiardi, J, Kliegel, M, Marie, D

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Chemical and structural properties of conducting nanofilaments in TiN/HfO2-based resistive switching structures von Calka, P, Martinez, E, Delaye, V, Lafond, D, Audoit, G, Mariolle, D, Chevalier, N, Grampeix, H, Cagli, C, Jousseaume, V, Guedj, C

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Indium and gallium diffusion through zirconia in the TiN/ZrO2/InGaAs stack von Ceballos-Sanchez, O., Martinez, E., Guedj, C., Veillerot, M., Herrera-Gomez, A.

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Engager le corps pour enseigner et apprendre: Diversité de perspectives von Duval, Hélène, Raymond, Caroline, Odier-Guedj, Delphine

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Origin of resistivity change in NiO thin films studied by hard x-ray photoelectron spectroscopy von Calka, P., Martinez, E., Lafond, D., Minoret, S., Tirano, S., Detlefs, B., Roy, J., Zegenhagen, J., Guedj, C.

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Interpretation of monoclinic hafnia valence electron energy-loss spectra by time-dependent density functional theory von Hung, L, Guedj, C, Bernier, N, Blaise, P, Olevano, V, Sottile, F

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Properties of innovative resistive memories studied by X-ray and UV photoemission von Martinez, E., Guedj, C., Calka, P., Minoret, S., Buckley, J., Bernard, Y., Jousseaume, V.

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Influence of electron-beam and ultraviolet treatments on low- k porous dielectrics von Martinez, E., Rochat, N., Guedj, C., Licitra, C., Imbert, G., Le Friec, Y.

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Resistance switching in HfO2-based OxRRAM devices von CALKA, P, MARTINEZ, E, LAFOND, D, DANSAS, H, TIRANO, S, JOUSSEAUME, V, BERTIN, F, GUEDJ, C

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Pore Sealing of a Porous Dielectric by Using a Thin PECVD a-SiC:H Conformal Liner von Jousseaume, V, Fayolle, M, Guedj, C, Haumesser, P H, Huguet, C, Pierre, F, Pantel, R, Feldis, H, Passemard, G

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Impact of patterning and ashing on electrical properties and reliability of interconnects in a porous SiOCH ultra low- k dielectric material von Aimadeddine, M., Arnal, V., Farcy, A., Guedj, C., Chevolleau, T., Possémé, N., David, T., Assous, M., Louveau, O., Volpi, F., Torres, J.

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Measurement of Complex Conductance in the PHz Frequency Range with Subnanometric Spatial Resolution: Application to the Grain Boundary of Monoclinic Hafnia von Guedj, Cyril

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Modification of porous ultra-low K dielectric by electron-beam curing von Guedj, C., Imbert, G., Martinez, E., Licitra, C., Rochat, N., Arnal, V.

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Electrical and Chemical Properties of the HfO[sub 2]/SiO[sub 2]/Si Stack: Impact of HfO[sub 2] Thickness and Thermal Budget von Martinez, E., Leroux, C., Benedetto, N., Gaumer, C., Charbonnier, M., Licitra, C., Guedj, C., Fillot, F., Lhostis, S.

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Study of void growth in 120 nm copper lines by in situ SEM von Claret, N., Guedj, C., Arnaud, L., Reimbold, G.

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Current-voltage characteristics of high current density silicon Esaki diodes grown by molecular beam epitaxy and the influence of thermal annealing von Dashiell, M.W., Troeger, R.T., Rommel, S.L., Adam, T.N., Berger, P.R., Guedj, C., Kolodzey, J., Seabaugh, A.C., Lake, R.

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Réfugiés et apatrides: Administrer l’asile en France (1920-1960) von Angoustures, Aline, Kévonian, Dzovinar, Mouradian, Claire

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Substitutional Ge in 3C–SiC von Guedj, C., Kolodzey, J.

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