Chemical and Spatial Differentiation of Syringyl and Guaiacyl Lignins in Poplar Wood via Time-of-Flight Secondary Ion Mass Spectrometry von Zhou, Chuanzhen, Li, Quanzi, Chiang, Vincent L, Lucia, Lucian A, Griffis, Dieter P

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Time-of-Flight-Secondary Ion Mass Spectrometry Method Development for High-Sensitivity Analysis of Acid Dyes in Nylon Fibers von Zhou, Chuanzhen, Li, Min, Garcia, Roberto, Crawford, Anne, Beck, Keith, Hinks, David, Griffis, Dieter P

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Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam von Zhu, Zhengmao, Stevie, Frederick A., Griffis, Dieter P.

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SIMS depth profiling of deuterium labeled polymers in polymer multilayers von Harton, Shane E., Stevie, Fred A., Griffis, Dieter P., Ade, Harald

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Discrimination between adsorption and coprecipitation in aquatic particle standards by surface analysis techniques: lead distributions in calcium carbonates von Fulghum, Julia E, Bryan, Scott R, Linton, Richard W, Bauer, Christopher F, Griffis, Dieter P

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Secondary ion imaging of heterogeneous organic polymer films von Simko, Steven J, Bryan, Scott R, Griffis, Dieter P, Murray, Royce W, Linton, Richard W

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Mass fractionation of carbon and hydrogen secondary ions upon Cs + and O 2 + bombardment of organic materials von Harton, Shane E., Zhu, Zhengmao, Stevie, Frederick A., Griffis, Dieter P., Ade, Harald

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Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O2+ bombardment of organic materials von Harton, Shane E., Zhu, Zhengmao, Stevie, Frederick A., Griffis, Dieter P., Ade, Harald

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Microcharacterization of trace elemental distributions within individual coal combustion particles using secondary ion mass spectrometry and digital imaging von Cox, X. B, Bryan, Scott R, Linton, Richard W, Griffis, Dieter P

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Comparison of Laser and Ion Microprobe Detection Sensitivity for Lead in Biological Microanalysis von Linton, Richard W, Bryan, Scott R, Schmidt, Peter F, Griffis, Dieter P

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Characterization of metal-complex-containing organic polymeric films by secondary ion mass spectrometry von Surridge, Nigel A, Linton, Richard W, Hupp, Joseph T, Bryan, Scott R, Meyer, Thomas J, Griffis, Dieter P

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Microcomputer approach to elemental depth profiling with Auger electron spectrometry von Griffis, Dieter P, Woodward, W. S, Linton, Richard W

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Primary electron beam current regulator for pulse-counting Auger electron spectroscopy von Woodward, W. S, Griffis, Dieter P, Linton, Rrichard W

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Method for water vapour enhanced ion-beam machining von SHEDD, GORDON M, VITARELLI, JAMES, RUSSELL, PHILLIP E, GRIFFIS, DIETER P, STARK, TERRENCE J

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Quantitative comparison of direct and derivative AES with XPS of metal sulfides von Griffis, Dieter P., Linton, Richard W.

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Chemically enhanced focused ion beam micro-machining of copper von GONZALES PEREZ JUAN CARLOS, GRIFFIS DIETER P, RUSSELL PHILLIP E

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Chemically enhanced focused ion beam micro-machining of copper von Russell, Phillip E, Griffis, Dieter P, Gonzales Perez, Juan Carlos

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Chemically enhanced focused ion beam micro-machining of copper von GONZALES PEREZ JUAN CARLOS, GRIFFIS DIETER P, RUSSELL PHILLIP E

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Chemically enhanced focused ion beam micro-machining of copper von GONZALES PEREZ JUAN CARLOS, GRIFFIS DIETER P, RUSSELL PHILLIP E

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Chemically enhanced focused ion beam micro-machining of copper von GONZALES PEREZ JUAN CARLOS, GRIFFIS DIETER P, RUSSELL PHILLIP E

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