Efficient computational modeling of electronic stopping power of organic polymers for proton therapy optimization von Matias, F., Silva, T. F., Koval, N. E., Pereira, J. J. N., Antunes, P. C. G., Siqueira, P. T. D., Tabacniks, M. H., Yoriyaz, H., Shorto, J. M. B., Grande, P. L.

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Confinement effects of ion tracks in ultrathin polymer films von Papaléo, R M, Thomaz, R, Gutierres, L I, de Menezes, V M, Severin, D, Trautmann, C, Tramontina, D, Bringa, E M, Grande, P L

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K-shell X-ray production cross sections of Ti, Cr, Ni and Zn induced by chlorine ions von Fernandes, F., Grande, P.L., Dias, J.F.

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MEIS, TEM and GISAXS investigation of buried Pb nanoislands in SiO2/Si interface von Sanchez, D.F., Rodrigues, F., Luce, F.P., Fabrim, Z.E., de M. Azevedo, G., Kellermann, G., Baptista, D.L., Grande, P.L., Fichtner, P.F.P.

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Deeper-band electron contributions to stopping power of silicon for low-energy ions von Matias, F., Grande, P. L., Koval, N. E., Shorto, J. M. B., Silva, T. F., Arista, N. R.

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Novel deposition method for gold and platinum nanoparticles on silicon substrates utilizing poly (ethylene glycol) 6000 for MEIS analysis von Klippel, T S, Fonteles, Henrique, Torgo, Daphne, Selau, Felipe, Borges, Eduarda, Konrad, Bárbara, Trombini, Henrique, Morais, Jonder, do Carmo M Alves, Maria, Benvenutti, E V, Baptista, D L, P L Grande, and

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Elucidating the capability of electron backscattering for 3D nano-structure determination von Trombini, H, Vos, M, Reboh, S, Grande, P L

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Depth profiling of ion-implanted samples by high-energy electron scattering von Trombini, H., Vos, M., Elliman, R. G., Grande, P. L.

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Convolution approximation for the energy loss, ionization probability and straggling of fast ions von Grande, P.L., Schiwietz, G.

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High-energy electron scattering from TiO2 surfaces von Vos, M., Grande, P.L.

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Characterization of nanoparticles through medium-energy ion scattering von Sortica, M. A., Grande, P. L., Machado, G., Miotti, L.

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Oxygen self-diffusion in HfO2 studied by electron spectroscopy von Vos, M, Grande, P L, Venkatachalam, D K, Nandi, S K, Elliman, R G

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Advanced ion energy loss models: Applications to subnanometric resolution elemental depth profiling von Pezzi, R.P., Grande, P.L., Copel, M., Schiwietz, G., Krug, C., Baumvol, I.J.R.

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Ground- and excited-state scattering potentials for the stopping of protons in an electron gas von Matias, F, Fadanelli, R C, Grande, P L, Koval, N E, Muiño, R Díez, Borisov, A G, Arista, N R, Schiwietz, G

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Charge-state related effects in sputtering of LiF by swift heavy ions von Assmann, W., Ban-d'Etat, B., Bender, M., Boduch, P., Grande, P.L., Lebius, H., Lelièvre, D., Marmitt, G.G., Rothard, H., Seidl, T., Severin, D., Voss, K.-O., Toulemonde, M., Trautmann, C.

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A comparison of ERBS spectra of compounds with Monte Carlo simulations von Vos, M., Marmitt, G. G, Grande, P. L.

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The influence of radiation damage on electrons and ion scattering measurements from PVC films von Tee, B.P.E., Vos, M., Trombini, H., Selau, F.F., Grande, P.L., Thomaz, R.

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A high-energy electron scattering study of the electronic structure and elemental composition of O-implanted Ta films used for the fabrication of memristor devices von Vos, M., Grande, P. L., Nandi, S. K., Venkatachalam, D. K., Elliman, R. G.

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Vanishing influence of the band gap on the charge exchange of slow highly charged ions in freestanding single-layer MoS2 von Creutzburg, S., Schwestka, J., Niggas, A., Inani, H., Tripathi, M., George, A., Heller, R., Kozubek, R., Madauss, L., McEvoy, N., Facsko, S., Kotakoski, J., Schleberger, M., Turchanin, A., Grande, P. L., Aumayr, F., Wilhelm, R. A.

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Antiparallel interface coupling evidenced by negative rotatable anisotropy in IrMn/NiFe bilayers von Schafer, D., Grande, P. L., Pereira, L. G., Azevedo, G. M., Harres, A., de Sousa, M. A., Pelegrini, F., Geshev, J.

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