A Modular 512-Channel Neural Signal Acquisition ASIC for High-Density 4096 Channel Electrophysiology von Papadopoulou, Aikaterini, Hermiz, John, Grace, Carl, Denes, Peter

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VeryFastCCD: a high frame rate soft X-ray detector von Goldschmidt, Azriel, Grace, Carl, Joseph, John, Krieger, Amanda, Tindall, Craig, Denes, Peter

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A 12-bit 80-MSample/s pipelined ADC with bootstrapped digital calibration von Grace, C.R., Hurst, P.J., Lewis, S.H.

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Investigating resource-efficient neutron/gamma classification ML models targeting eFPGAs von Johnson, Jyothisraj, Boxer, Billy, Prakash, Tarun, Grace, Carl, Sorensen, Peter, Tripathi, Mani

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Characterization of the BigRock 28 nm fast timing Analog Front End von Krieger, Amanda, Caisley, Kennedy, Garcia-Sciveres, Maurice, Grace, Carl, Heim, Timon, Zhang, Zhicai

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Multiplexed Oversampling Digitizer in 65 nm CMOS for Column-Parallel CCD Readout von Grace, C. R., Walder, J., Denes, P., von der Lippe, H.

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A 90 nm CMOS DSP MLSD Transceiver With Integrated AFE for Electronic Dispersion Compensation of Multimode Optical Fibers at 10 Gb/s von Agazzi, O.E., Hueda, M.R., Crivelli, D.E., Carrer, H.S., Nazemi, A., Luna, G., Ramos, F., Lopez, R., Grace, C., Kobeissy, B., Abidin, C., Kazemi, M., Kargar, M., Marquez, C., Ramprasad, S., Bollo, F., Posse, V., Wang, S., Asmanis, G., Eaton, G., Swenson, N., Lindsay, T., Voois, P.

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Radiation-Tolerant Code-Density Calibration of Nyquist-Rate Analog-to-Digital Converters von Grace, C. R., Denes, P., Gnani, D., von der Lippe, H., Walder, J.

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AD-HOC NETWORK OF READOUT APPLICATION-SPECIFIC INTEGRATED CIRCUITS FOR RELIABLE DETECTOR INSTRUMENTATION von GRACE, Carl, DWYER, Daniel

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Investigating Resource-efficient Neutron/Gamma Classification ML Models Targeting eFPGAs von Johnson, Jyothisraj, Boxer, Billy, Prakash, Tarun, Grace, Carl, Sorensen, Peter, Tripathi, Mani

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Development of next-generation nuclear physics integrated readout electronics for GRETINA von Zimmermann, Sergio, Abgrall, Nicolas, Bantel, Michael, Moeller-Chan, Victoria, Cromaz, Mario, Grace, Carl, Macchiavelli, Augusto

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Code-density calibration of Nyquist-rate analog-to-digital converters von Grace, Carl R., Denes, Peter, Gnani, Dario, von der Lippe, Henrik, Walder, Jean-Pierre

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A Flexible Front-End Signal Processor for High-Speed Image Sensor Readout von Grace, Carl, Gnani, Dario, Walder, Jean-Pierre, Zheng, Bob

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A fast low noise CMOS charge sensitive preamplifier for column parallel CCD readout von Walder, J. P., Denes, P., Grace, C., von der Lippe, H., Zheng, B.

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Big Industry Engagement to Benefit HEP: Microelectronics Support from Large CAD Companies von Carini, Gabriella, Demarteau, Marcel, Denes, Peter, Dragone, Angelo, Fahim, Farah, Grace, Carl, Li, Shaorui, Newcomer, F Mitch, Yi, Brianna

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Cryogenic Characterization of 180 nm CMOS Technology at 100 mK von Huang, Roger, Gnani, Dario, Grace, Carl, Kolomensky, Yury, Yuan Mei, Papadopoulou, Aikaterini

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Multiplexed oversampling digitizer in 65 nm CMOS for column-parallel CCD readout von Grace, C. R., Walder, J-P, von der Lippe, H.

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A 12b 80MS/s pipelined ADC with bootstrapped digital calibration von GRACE, Carl R, HURST, Paul J, LEWIS, Stephen H

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Monolithic Active Pixel Sensors on CMOS technologies von Apadula, Nicole, Armstrong, Whitney, Brau, James, Breidenbach, Martin, Caputo, R, Carinii, Gabriella, Collu, Alberto, Demarteau, Marcel, Deptuch, Grzegorz, Dragone, Angelo, Giacomini, Gabriele, Grace, Carl, Graf, Norman, Greiner, Leo, Herbst, Ryan, Haller, Gunther, Jadhav, Manoj, Joosten, Sylvester, Kenney, Christopher J, Kierans, C, Kim, Jihee, Markiewicz, Thomas, Mei, Yuan, Metcalfe, Jessica, Meziani, Zein-Eddine, Nelson, Tim K, Peng, Chao, Pinaroli, Giovanni, Reimer, Paul E, Rota, Lorenzo, Scott, Marshall, Segal, Julie, Sichterman, Ernst, Sinev, Nikolai, Steinhebel, A, Strom, David, Tricoli, Alessandro, Vernieri, Caterina, Young, Charles, Zurek, Maria

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Analog-to-digital converter using lookahead pipelined architecture and open-loop residue amplifiers von GRACE CARL

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