Comparative study of the mechanical properties of nanostructured thin films on stretchable substrates von Djaziri, S., Renault, P.-O., Le Bourhis, E., Goudeau, Ph, Faurie, D., Geandier, G., Mocuta, C., Thiaudière, D.

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Influence of nitrogen content on the structural, mechanical and electrical properties of TiN thin films von Vaz, F., Ferreira, J., Ribeiro, E., Rebouta, L., Lanceros-Méndez, S., Mendes, J.A., Alves, E., Goudeau, Ph, Rivière, J.P., Ribeiro, F., Moutinho, I., Pischow, K., de Rijk, J.

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Structural, electrical, optical, and mechanical characterizations of decorative ZrOxNy thin films von Carvalho, P., Vaz, F., Rebouta, L., Cunha, L., Tavares, C. J., Moura, C., Alves, E., Cavaleiro, A., Goudeau, Ph, Le Bourhis, E., Rivière, J. P., Pierson, J. F., Banakh, O.

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Preparation of magnetron sputtered TiNxOy thin films von Vaz, F., Cerqueira, P., Rebouta, L., Nascimento, S.M.C., Alves, E., Goudeau, Ph, Rivière, J.P.

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X-ray strain analysis of {111} fiber-textured thin films independent of grain-interaction models von Faurie, D., Renault, P.-O., Le Bourhis, E., Chauveau, T., Castelnau, O., Goudeau, Ph

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Determination of elastic constants of a fiber-textured gold film by combining synchrotron x-ray diffraction and in situ tensile testing von Faurie, D., Renault, P.-O., Le Bourhis, E., Goudeau, Ph

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In situ electrical and mechanical study of Indium Tin Oxide films deposited on polyimide substrate by Xe ion beam sputtering von Chommaux, T., Renault, P.O., Thiaudière, D., Godard, P., Paumier, F., Girardeau, T., Hurand, S., Goudeau, PH

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Mechanical characterization of reactively magnetron-sputtered TiN films von Vaz, F, Machado, P, Rebouta, L, Cerqueira, P, Goudeau, Ph, Rivière, J.P, Alves, E, Pischow, K, de Rijk, J

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Structural, optical and mechanical properties of coloured TiNxOy thin films von Vaz, F, Cerqueira, P, Rebouta, L, Nascimento, S.M.C, Alves, E, Goudeau, Ph, Rivière, J.P, Pischow, K, de Rijk, J

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Physical and morphological characterization of reactively magnetron sputtered TiN films von Vaz, F, Machado, P, Rebouta, L, Mendes, J.A, Lanceros-Méndez, S, Cunha, L, Nascimento, S.M.C, Goudeau, Ph, Rivière, J.P, Alves, E, Sidor, A

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Yield surface of polycrystalline thin films as revealed by non-equibiaxial loadings at small deformation von Djaziri, S., Faurie, D., Renault, P.-O., Le Bourhis, E., Goudeau, Ph, Geandier, G., Thiaudière, D.

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X-Ray diffraction measurement of the Poisson's ratio in Mo sublayers of Ni/Mo multilayers von Villain, P., Renault, P.-O., Goudeau, Ph, Badawi, K.F.

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Deformation modes of nanostructured thin film under controlled biaxial deformation von Djaziri, S., Faurie, D., Le Bourhis, E., Goudeau, Ph, Renault, P.-O., Mocuta, C., Thiaudière, D., Hild, F.

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Elastic-strain distribution in metallic film-polymer substrate composites von Geandier, G., Renault, P.-O., Le Bourhis, E., Goudeau, Ph, Faurie, D., Le Bourlot, C., Djémia, Ph, Castelnau, O., Chérif, S. M.

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Strain relaxation in He implanted UO2 polycrystals under thermal treatment: An in situ XRD study von Palancher, H., Kachnaoui, R., Martin, G., Richard, A., Richaud, J.-C., Onofri, C., Belin, R., Boulle, A., Rouquette, H., Sabathier, C., Carlot, G., Desgardin, P., Sauvage, T., Rieutord, F., Raynal, J., Goudeau, Ph, Ambard, A.

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Elastic anisotropy of polycrystalline Au films: Modeling and respective contributions of X-ray diffraction, nanoindentation and Brillouin light scattering von Faurie, D., Djemia, P., Le Bourhis, E., Renault, P.-O., Roussigné, Y., Chérif, S.M., Brenner, R., Castelnau, O., Patriarche, G., Goudeau, Ph

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Multi-scale X-ray diffraction study of strains induced by He implantation in UO2 polycrystals von Richard, A., Castelier, E., Palancher, H., Micha, J.S., Rouquette, H., Ambard, A., Garcia, Ph, Goudeau, Ph

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In situ diffraction strain analysis of elastically deformed polycrystalline thin films, and micromechanical interpretation von Faurie, D., Castelnau, O., Brenner, R., Renault, P.-O., Le Bourhis, E., Goudeau, Ph

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Study of texture effect on elastic properties of Au thin films by X-ray diffraction and in situ tensile testing von Faurie, D., Renault, P.-O., Le Bourhis, E., Goudeau, Ph

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Measuring thin film and multilayer elastic constants by coupling in situ tensile testing with x-ray diffraction von Badawi, K. F., Villain, P., Goudeau, Ph, Renault, P.-O.

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