Treffer 1 - 9 von 9 für Suche 'GOOSEN, Johannes Frans Lodewijk', Suchdauer: 0,62s Treffer weiter einschränken
  1. 1
    PICKUP UNIT AND CORRESPONDING MANUFACTURING METHOD

    PICKUP UNIT AND CORRESPONDING MANUFACTURING METHOD von GOOSEN, Johannes Frans Lodewijk, VAN DER VEEN, Gijs, LIU, Yazhao

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  2. 2
    SYSTEM AND METHOD FOR DETERMINING AN ORIENTATION OF A DEVICE

    SYSTEM AND METHOD FOR DETERMINING AN ORIENTATION OF A DEVICE von GOOSEN, Johannes Frans Lodewijk, VAN DER VEEN, Gijs, LIU, Yazhao

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  3. 3
    PICK-AND-PLACE APPARATUS WITH FORCE MEASUREMENT AND CORRESPONDING PICKING AND PLACING METHODS

    PICK-AND-PLACE APPARATUS WITH FORCE MEASUREMENT AND CORRESPONDING PICKING AND PLACING METHODS von GOOSEN, Johannes Frans Lodewijk, VAN DER VEEN, Gijs, LIU, Yazhao

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  4. 4
    PICK-AND-PLACE APPARATUS WITH FORCE MEASUREMENT AND CORRESPONDING PICKING AND PLACING METHODS

    PICK-AND-PLACE APPARATUS WITH FORCE MEASUREMENT AND CORRESPONDING PICKING AND PLACING METHODS von van der Veen, Gijs, Liu, Yazhao, Goosen, Johannes Frans Lodewijk

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  5. 5
    SYSTEM AND METHOD FOR DETERMINING AN ORIENTATION OF A DEVICE

    SYSTEM AND METHOD FOR DETERMINING AN ORIENTATION OF A DEVICE von van der Veen, Gijs, Liu, Yazhao, Goosen, Johannes Frans Lodewijk

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  6. 6
    PICKUP UNIT AND CORRESPONDING MANUFACTURING METHOD

    PICKUP UNIT AND CORRESPONDING MANUFACTURING METHOD von van der Veen, Gijs, Liu, Yazhao, Goosen, Johannes Frans Lodewijk

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  7. 7
    METHOD FOR DETERMINING A SPRING CONSTANT FOR A DEFORMABLE SCANNING PROBE MICROSCOPE ELEMENT, AND SCANNING PROBE MICROSCOPE AND CALIBRATION DEVICE ARRANGED FOR DETERMINING A SPRING CONSTANT FOR A PROBE ELEMENT

    METHOD FOR DETERMINING A SPRING CONSTANT FOR A DEFORMABLE SCANNING PROBE MICROSCOPE ELEMENT, AND SCANNING PROBE MICROSCOPE AND CALIBRATION DEVICE ARRANGED FOR DETERMINING A SPRING... von BOSSCHE, ADRIANUS, YANG, CHUNG-KAI, SADEGHIAN, HAMED, KEULEN, ALFRED, FRENCH, PATRICK JAMES, GOOSEN, JOHANNES FRANS LODEWIJK

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  8. 8
    METHOD FOR DETERMINING A SPRING CONSTANT FOR A DEFORMABLE SCANNING PROBE MICROSCOPE ELEMENT, AND SCANNING PROBE MICROSCOPE AND CALIBRATION DEVICE ARRANGED FOR DETERMINING A SPRING CONSTANT FOR A PROBE ELEMENT

    METHOD FOR DETERMINING A SPRING CONSTANT FOR A DEFORMABLE SCANNING PROBE MICROSCOPE ELEMENT, AND SCANNING PROBE MICROSCOPE AND CALIBRATION DEVICE ARRANGED FOR DETERMINING A SPRING... von VAN KEULEN, ALFRED, BOSSCHE, ADRIANUS, FRENCH, PATRICK, JAMES, YANG, CHUNG-KAI, SADEGHIAN, HAMED, GOOSEN, JOHANNES, FRANS, LODEWIJK

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  9. 9
    Thermal actuator for e.g. microfluidic components, comprises alternating layers of two different materials

    Thermal actuator for e.g. microfluidic components, comprises alternating layers of two different materials von ALFRED VAN KEULEN, PASQUALINA MARIA SARRO, GIH KEONG LAU, JOHANNES FRANS LODEWIJK GOOSEN, DUC TRINH CHU

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