Structured illumination fluorescence microscopy with distorted excitations using a filtered blind-SIM algorithm von Ayuk, R, Giovannini, H, Jost, A, Mudry, E, Girard, J, Mangeat, T, Sandeau, N, Heintzmann, R, Wicker, K, Belkebir, K, Sentenac, A

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Nanometric resolution with far-field optical profilometry von Arhab, S, Soriano, G, Ruan, Y, Maire, G, Talneau, A, Sentenac, D, Chaumet, P C, Belkebir, K, Giovannini, H

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Tomographic diffractive microscopy with agile illuminations for imaging targets in a noisy background von Zhang, T, Godavarthi, C, Chaumet, P C, Maire, G, Giovannini, H, Talneau, A, Prada, C, Sentenac, A, Belkebir, K

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Full polarization optical profilometry von ARHAB, S, GIOVANNINI, H, BELKEBIR, K, SORIANO, G

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Laser assisted fabrication of random rough surfaces for optoelectronics von Brissonneau, V., Escoubas, L., Flory, F., Berginc, G., Maire, G., Giovannini, H.

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Tomographic diffractive microscopy with a wavefront sensor von Ruan, Y, Bon, P, Mudry, E, Maire, G, Chaumet, P C, Giovannini, H, Belkebir, K, Talneau, A, Wattellier, B, Monneret, S, Sentenac, A

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Full wave optical profilometry von Arhab, S, Soriano, G, Belkebir, K, Sentenac, A, Giovannini, H

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Increasing the lateral resolution of 4Pi fluorescence microscopes von Sandeau, Nicolas, Giovannini, Hugues

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Increasing the angular tolerance of resonant grating filters with doubly periodic structures von Lemarchand, F, Sentenac, A, Giovannini, H

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Scattering from rough inhomogeneous media: splitting of surface and volume scattering von Sentenac, A, Giovannini, H, Saillard, M

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An antireflective silicon grating working in the resonance domain for the near infrared spectral region von Escoubas, L., Simon, J.J., Loli, M., Berginc, G., Flory, F., Giovannini, H.

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Extraction of light from sources located inside waveguide grating structures von Rigneault, H, Lemarchand, F, Sentenac, A, Giovannini, H

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Observation of the interferences between the emitted beams in a 4Pi microscope by partial coherence interferometry von Sandeau, N., Giovannini, H., Lenne, P.-F., Rigneault, H.

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Scattering-reduction effect with overcoated rough surfaces: theory and experiment von Giovannini, H, Amra, C

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Full polarization optical profilometry von Arhab, Slimane, Giovannini, H., Belkebir, K., Soriano, G.

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Ellipsometry of light scattering from multilayer coatings von Deumié, C, Giovannini, H, Amra, C

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Dielectric thin films for maximized absorption with standard quality black surfaces von Giovannini, H, Amra, C

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A reappraisal of preoperative chemoradiation for localized pancreatic head ductal adenocarcinoma in a 5-year single-institution experience von Moutardier, V, Turrini, O, Huiart, L, Viret, F, Giovannini, M.H, Magnin, V, Lelong, B, Bories, E, Guiramand, J, Sannini, A, Giovannini, M, Houvenaeghel, G, Blache, J.L, Moutardier, J.C, Delpero, J.R

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A Global Analysis of Mucormycosis in France: The RetroZygo Study (2005-2007) von Lanternier, F., Dannaoui, E., Morizot, G., Elie, C., Garcia-Hermoso, D., Huerre, M., Bitar, D., Dromer, F., Lortholary, O.

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Nanometric Resolution with Far-Field Optical Profilometry von Arhab, Slimane, Soriano, G., Ruan, Y., Maire, G., Talneau, A., Sentenac, D., Chaumet, P., Belkebir, K., Giovannini, H.

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