Guest Editorial: Analog, Mixed-Signal and RF Testing von Léger, Gildas, Wegener, Carsten

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Digital Non-Linearity Calibration for ADCs With Redundancy Using a New LUT Approach von Gines, Antonio, Leger, Gildas, Peralias, Eduardo

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An adaptive simulation framework for AMS-RF test quality von Gutierrez, Valentin, Leger, Gildas

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Behavioral Model for High-Speed SAR ADCs With On-Chip References von Dominguez-Matas, Carlos, Gines, Antonio, Otin, Aranzazu, Gutierrez, Valentin, Leger, Gildas, Peralias, Eduardo

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Nonintrusive Machine Learning-Based Yield Recovery and Performance Recentering for mm-Wave Power Amplifiers: A Two-Stage Class-A Power Amplifier Case Study von Cilici, Florent, Margalef-Rovira, Marc, Lauga-Larroze, Estelle, Bourdel, Sylvain, Leger, Gildas, Vincent, Loic, Mir, Salvador, Barragan, Manuel J.

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Implementation of Background Calibration for Redundant FLASH ADC von Darwish, Hala, Reig, Càndid, Leger, Gildas

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A Nonintrusive Machine Learning-Based Test Methodology for Millimeter-Wave Integrated Circuits von Cilici, Florent, Barragan, Manuel J., Lauga-Larroze, Estelle, Bourdel, Sylvain, Leger, Gildas, Vincent, Loic, Mir, Salvador

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Brownian distance correlation-directed search: A fast feature selection technique for alternate test von Leger, Gildas, Barragan, Manuel J.

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On-chip sinusoidal signal generation with harmonic cancelation for analog and mixed-signal BIST applications von Barragan, Manuel J., Leger, Gildas, Vazquez, Diego, Rueda, Adoracion

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On Chopper Effects in Discrete-Time \Sigma\Delta Modulators von Leger, Gildas, Gines Arteaga, Antonio J., Peralias Macias, Eduardo J., Rueda, Adoración

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TA03-04: Statistical approach to defect simulation in complex analog and mixed-signal circuits: application to radiation-induced single-event transients von Leger, Gildas

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A tissue impedance measurement chip for myocardial ischemia detection von Yufera, A., Rueda, A., Munoz, J.M., Doldan, R., Leger, G., Rodriguez-Villegas, E.O.

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On Chopper Effects in Discrete-Time [Formula Omitted] Modulators von Leger, Gildas, Gines Arteaga, Antonio J, Peralias Macias, Eduardo J, Rueda, Adoración

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Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures von Barragán, Manuel J., Fiorelli, Rafaella, Leger, Gildas, Rueda, Adoración, Huertas, José L.

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Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs von Barragan, M. J., Fiorelli, R., Leger, G., Rueda, A., Huertas, J. L.

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Efficient selection of signatures for analog/RF alternate test von Barragan, Manuel J., Leger, Gildas

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Assessing AMS-RF Test Quality by Defect Simulation von Gutierrez Gil, Valentin, Gines Arteaga, Antonio J., Leger, Gildas

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Impact of random channel mismatch on the SNR and SFDR of time-interleaved ADCs von Leger, G., Peralias, E.J., Rueda, A., Huertas, J.L.

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Multi-condition alternate test of analog, mixed-signal, and RF systems von Barragan, Manuel J., Leger, Gildas, Huertas, Jose L.

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Sinusoidal signal generation for mixed-signal BIST using a harmonic-cancellation technique von Barragan, M. J., Leger, G., Vazquez, D., Rueda, A.

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