Improving the reliability of small‐ and wide‐angle X‐ray scattering measurements of anisotropic precipitates in metallic alloys using sample rotation von Perrin, Thomas, Chahine, Gilbert A., Arnaud, Stéphan, Després, Arthur, Heugue, Pierre, Deschamps, Alexis, De Geuser, Frédéric

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Metal–ferroelectric supercrystals with periodically curved metallic layers von Hadjimichael, Marios, Li, Yaqi, Zatterin, Edoardo, Chahine, Gilbert A., Conroy, Michele, Moore, Kalani, Connell, Eoghan N. O’, Ondrejkovic, Petr, Marton, Pavel, Hlinka, Jiri, Bangert, Ursel, Leake, Steven, Zubko, Pavlo

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Evaluation of titanium alloy fabricated using electron beam melting system for dental applications von Koike, Mari, Martinez, Kelly, Guo, Lilly, Chahine, Gilbert, Kovacevic, Radovan, Okabe, Toru

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Correlation of Optical, Structural, and Compositional Properties with V‑Pit Distribution in InGaN/GaN Multiquantum Wells von Zoellner, Marvin Hartwig, Chahine, Gilbert André, Lahourcade, Lise, Mounir, Christian, Manganelli, Costanza Lucia, Schülli, Tobias Urs, Schwarz, Ulrich Theodor, Zeisel, Roland, Schroeder, Thomas

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The Nanodiffraction beamline ID01/ESRF: a microscope for imaging strain and structure von Leake, Steven J., Chahine, Gilbert A., Djazouli, Hamid, Zhou, Tao, Richter, Carsten, Hilhorst, Jan, Petit, Lucien, Richard, Marie-Ingrid, Morawe, Christian, Barrett, Raymond, Zhang, Lin, Homs-Regojo, Roberto A., Favre-Nicolin, Vincent, Boesecke, Peter, Schülli, Tobias U.

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Influence of the Ge content on the lithiation process of crystalline Si 1− x Ge x nanoparticle-based anodes for Li-ion batteries von Zapata Dominguez, Diana, Berhaut, Christopher L., Kumar, Praveen, Jouneau, Pierre-Henri, Desrues, Antoine, Herlin-Boime, Nathalie, Boudet, Nathalie, Blanc, Nils, Chahine, Gilbert A., Haon, Cédric, Tardif, Samuel, Lyonnard, Sandrine, Pouget, Stéphanie

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Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping von Chahine, Gilbert André, Richard, Marie-Ingrid, Homs-Regojo, Roberto Arturo, Tran-Caliste, Thu Nhi, Carbone, Dina, Jaques, Vincent Louis Robert, Grifone, Raphael, Boesecke, Peter, Katzer, Jens, Costina, Ioan, Djazouli, Hamid, Schroeder, Thomas, Schülli, Tobias Urs

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Influence of the Ge content on the lithiation process of crystalline Si1−xGex nanoparticle-based anodes for Li-ion batteries von Diana Zapata Dominguez, Berhaut, Christopher L, Kumar, Praveen, Pierre-Henri Jouneau, Desrues, Antoine, Herlin-Boime, Nathalie, Boudet, Nathalie, Blanc, Nils, Chahine, Gilbert A, Haon, Cédric, Tardif, Samuel, Lyonnard, Sandrine, Pouget, Stéphanie

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Real‐ and Q‐space travelling: multi‐dimensional distribution maps of crystal‐lattice strain (ϵ044) and tilt of suspended monolithic silicon nanowire structures von Dolabella, Simone, Frison, Ruggero, Chahine, Gilbert A., Richter, Carsten, Schulli, Tobias U., Tasdemir, Zuhal, Alaca, B. Erdem, Leblebici, Yusuf, Dommann, Alex, Neels, Antonia

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Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X‑ray Diffraction Microscopy von Zoellner, Marvin H, Richard, Marie-Ingrid, Chahine, Gilbert A, Zaumseil, Peter, Reich, Christian, Capellini, Giovanni, Montalenti, Francesco, Marzegalli, Anna, Xie, Ya-Hong, Schülli, Tobias U, Häberlen, Maik, Storck, Peter, Schroeder, Thomas

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Advanced Non-Destructive in Situ Characterization of Metals with the French Collaborating Research Group D2AM/BM02 Beamline at the European Synchrotron Radiation Facility von Chahine, Gilbert André, Blanc, Nils, Arnaud, Stephan, De Geuser, Frédéric, Guinebretière, René, Boudet, Nathalie

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Structural Mapping of Functional Ge Layers Grown on Graded SiGe Buffers for sub-10 nm CMOS Applications Using Advanced X‑ray Nanodiffraction von Richard, Marie-Ingrid, Zoellner, Marvin H, Chahine, Gilbert A, Zaumseil, Peter, Capellini, Giovanni, Häberlen, Maik, Storck, Peter, Schülli, Tobias U, Schroeder, Thomas

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A study of the strain distribution by scanning X‐ray diffraction on GaP/Si for III–V monolithic integration on silicon von Zhou, Ang, Ping Wang, Yan, Cornet, Charles, Léger, Yoan, Pédesseau, Laurent, Favre-Nicolin, Vincent, Chahine, Gilbert André, Schülli, Tobias Urs, Eymery, Joël, Bahri, Mounib, Largeau, Ludovic, Patriarche, Gilles, Durand, Olivier, Létoublon, Antoine

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In situ structural evolution of single particle model catalysts under ambient pressure reaction conditions von Fernández, Sara, Gao, Lu, Hofmann, Jan Philipp, Carnis, Jérôme, Labat, Stéphane, Chahine, Gilbert A, van Hoof, Arno J F, Verhoeven, M W G M Tiny, Schülli, Tobias U, Hensen, Emiel J M, Thomas, Olivier, Richard, Marie-Ingrid

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X-ray Excited Optical Fluorescence and Diffraction Imaging of Reactivity and Crystallinity in a Zeolite Crystal: Crystallography and Molecular Spectroscopy in One von Ristanović, Zoran, Hofmann, Jan P., Richard, Marie-Ingrid, Jiang, Tao, Chahine, Gilbert A., Schülli, Tobias U., Meirer, Florian, Weckhuysen, Bert M.

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Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy von Schäfer, Norbert, Wilkinson, Angus J., Schmid, Thomas, Winkelmann, Aimo, Chahine, Gilbert A., Schülli, Tobias U., Rissom, Thorsten, Marquardt, Julien, Schorr, Susan, Abou-Ras, Daniel

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The design and production of Ti-6Al-4V ELI customized dental implants von Chahine, Gilbert, Koike, Mari, Okabe, Toru, Smith, Pauline, Kovacevic, Radovan

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Dislocation engineering in SiGe on periodic and aperiodic Si(001) templates studied by fast scanning X-ray nanodiffraction von Mondiali, Valeria, Bollani, Monica, Cecchi, Stefano, Richard, Marie-Ingrid, Schülli, Tobias, Chahine, Gilbert, Chrastina, Daniel

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Fatigue testing of electron beam-melted Ti-6Al-4V ELI alloy for dental implants von Joshi, Gaurav V., Duan, Yuanyuan, Neidigh, John, Koike, Mari, Chahine, Gilbert, Kovacevic, Radovan, Okabe, Toru, Griggs, Jason A.

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In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification von Davydok, Anton, Cornelius, Thomas W., Ren, Zhe, Leclere, Cedric, Chahine, Gilbert, Schülli, Tobias, Lauraux, Florian, Richter, Gunther, Thomas, Olivier

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