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  1. 1
    Study of CMOS Process Variation by Multiplexing Analog Characteristics

    Study of CMOS Process Variation by Multiplexing Analog Characteristics von Gettings, K., Boning, D.S.


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  2. 2
    Test Circuit for Study of CMOS Process Variation by Measurement of Analog Characteristics

    Test Circuit for Study of CMOS Process Variation by Measurement of Analog Characteristics von Gettings, K.M.G., Boning, D.S.


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  3. 3
    Phosphor-loaded waveguide

    Phosphor-loaded waveguide von Lyszczarz, Theodore M, Burke, Marc J, Vai, Mankuan M, Kramer, Joshua, Gettings, Karen M. G. V, Geis, Michael W

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  4. 4
    Biquad implementation of an IIR filter for IQ mismatch correction in an SoC RF receiver

    Biquad implementation of an IIR filter for IQ mismatch correction in an SoC RF receiver von Gettings, Karen M. G. V., Bolstad, Andrew K., Ericson, Michael N., Xiao Wang

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  5. 5
    Methods and apparatus for inline variability measurement of integrated circuit components

    Methods and apparatus for inline variability measurement of integrated circuit components von Bhushan, Manjul, Gettings, Karen M. G. V, Haensch, Wilfried E, Ji, Brian L, Ketchen, Mark B

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  6. 6
    Methods and apparatus for inline variability measurement of integrated circuit components

    Methods and apparatus for inline variability measurement of integrated circuit components von HAENSCH WILFRIED E, KETCHEN MARK B, BHUSHAN MANJUL, GETTINGS KAREN M. G. V, JI BRIAN L

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  7. 7
    Methods and apparatus for inline variability measurement of integrated circuit components

    Methods and apparatus for inline variability measurement of integrated circuit components von Bhushan, Manjul, Gettings, Karen M. G. V, Haensch, Wilfried E, Ji, Brian L, Ketchen, Mark B

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  8. 8
    Methods and apparatus for inline variability measurement of integrated circuit components

    Methods and apparatus for inline variability measurement of integrated circuit components von HAENSCH WILFRIED E, KETCHEN MARK B, BHUSHAN MANJUL, GETTINGS KAREN M. G. V, JI BRIAN L

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