Characterization of electrically stressed power device metallization using nano-CT imaging von Mueller, Dominik, Fella, Christian, Altmann, Frank, Graetz, Jonas, Balles, Andreas, Ring, Matt, Gambino, Jeff

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Investigations of internal stresses in high-voltage devices with deep trenches von Hieckmann, Ellen, Mühle, Uwe, Chekhonin, Paul, Zschech, Ehrenfried, Gambino, Jeff

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Via resistance increase accelerated by thermal stress von Qin, Wentao, Donaldson, Scott, Rogers, Dan, Belisle, Chuck, Grivna, Gordy, Boukhanfra, Lahcen, Thiefain, Julien, Barrientos, Denise, Steinwall, Jim, Chang, George, Gambino, Jeff, Burgin, Rebecca

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Process Challenges for Integration of Copper Interconnects with Low-k Dielectrics von Gambino, Jeff

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Copper interconnect technology for the 32 nm node and beyond von Gambino, J., Fen Chen, He, J.

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Improved Frequency Response in a SiGe npn Device through Improved Dopant Activation von Adkisson, James, Khater, Marwan, Gambino, Jeff, Cheng, Peng, Jain, Vibhor, Camillo-Castillo, Renata, Lavoie, Christian, Sutton, Akil, Gluschenkov, Oleg, Liu, Q.Z., McDevitt, Tom, Engelmann, Sebastian, Pekarik, Jack, Harame, D. L.

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Stress Characterization of Tungsten-Filled Through Silicon via Arrays Using Very High Resolution Multi-Wavelength Raman Spectroscopy von Gambino, Jeff, Vanslette, Daniel, Webb, Bucknell, Luce, Cameron, Ueda, Takeshi, Ishigaki, Toshikazu, Kang, Kitaek, Yoo, Woo Sik

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Reliability of Copper Interconnects: Stress-Induced Voids von Gambino, Jeff, Lee, Tom C., Chen, Fen, Sullivan, Timothy D.

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A high-resistivity SiGe BiCMOS technology for WiFi RF front-end-IC solutions von Joseph, Alvin, Gambino, Jeff, Rassel, Robert M., Johnson, Eric, Ding, Hanyi, Parthasarthy, Shyam, Vanakuru, Venkata, Sharma, Santosh, Jaffe, Mark, Liu, Derrick, Zierak, Michael, Camillo-Castillo, Renata, Stamper, Anthony, Dunn, Jim

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A Self-Aligned Sacrificial Emitter Process for High Performance SiGe HBT in BiCMOS von Liu, Q.Z., Adkisson, James, Benoit, John, Camillo-Castillo, Renata, Chan, Kevin, Cheng, Peng, Ellis-Monaghan, John, Gabert, Tom, Gambino, Jeff, Gray, Peter, Hasselbach, Joe, Jain, Vibhor, Khater, Marwan, Leidy, Bob, Park, Dae-Gyu, Pekarik, Jack, Tiersch, Matt, Willets, Christa, Zetterlund, Bjorn K., Harame, D. L.

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Process Challenges for Integration of Copper Interconnects with Low-k Dielectrics von Gambino, Jeff

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High yielding self-aligned contact process for a 0.150-μm DRAM technology von RUPP, Thomas S, DOBUZINSKY, David, ZHIJIAN LU, SARDESAI, Viraj Y, LIU, Hang-Yip, MALDEI, Michael, FALTERMEIER, John, GAMBINO, Jeff

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Stress Characterization of Tungsten-Filled through Silicon via Arrays Using Very High Resolution Multi-Wavelength Raman Spectroscopy von Gambino, Jeff, Vanslette, Daniel, Webb, Bucknell, Luce, Cameron, Ueda, Takeshi, Ishigaki, Toshikazu, Kang, Kitaek, Yoo, Woo Sik

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Improved Frequency Response in a SiGe npn Device through Improved Dopant Activation von Adkisson, James, Khater, Marwan, Gambino, Jeff, Cheng, Peng, Jain, Vibhor, Camillo-Castillo, Renata, Lavoie, Christian, Sutton, Akil, Gluschenkov, Oleg, Liu, Q.Z., McDevitt, Tom, Engelmann, Sebastian, Pekarik, Jack, Harame, D.

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Effect of Wire Thickness on Electromigration and Stress Migration Lifetime of Cu von Christiansen, C., Gambino, J., Therrien, J., Hunt, D., Gill, J.

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Effect of CoWP Capping Layers on Dielectric Breakdown of SiO2 von Gambino, J., Fen Chen, Mongeon, S., Meatyard, D., Lee, T., Lee, B., Bamnolker, H., Hall, L., Li, N., Hernandez, M., Little, P., Hamed, M., Ivanov, I.

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Dual damascene aluminum for 1-Gbit DRAMs, part 3 von Iggulden, Roy, Clevenger, Larry, Costrini, Greg, Dobuzinsky, David, Filippi, Ronald, Gambino, Jeff, Lin, Chenting, Schnabel, Florian, Weber, Stefan, Gignac, Lynne, Ronay, Maria

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Annotated Bibliography of Research in the Teaching of English von Autry, Faye, Brodeur, Katherine, Doerr-Stevens, Candance, Frederick, Amy, Haling, Linda, Jocius, Robin, Deventer, Megan McDonald Van, Peterson, Debra, Share, Jeff, Suk, Andrea, Wagner, Danielle, Ortmann, Lisa, Stutelberg, Erin, Allen, Kathryn, Beach, Richard, Cole, Mikel W., Faase, Chelsea, Gambino, Andrea, Israelson, Madeleine, Madison, Stephanie M., O’Byrne, W. Ian, Schick, Anna, Sterner, Sara K., Sulzer, Mark, Yoon, Stephanie Rollag

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Annotated Bibliography of Research in the Teaching of English von Brodeur, Katherine, Crampton, Anne, Faase, Chelsea, Israelson, Madeleine, Madison, Stephanie M., Ian O’Byrne, W., Ortmann, Lisa, Stutelberg, Erin, Allen, Kathryn, Beach, Richard, Kleese, Nick, Peterson, Debra, Rollag Yoon, Stephanie, Schick, Anna, Gambino, Andrea, Share, Jeff, Cole, Mikel, Doerr-Stevens, Candance, Frederick, Amy, Jocius, Robin, Van Deventer, Megan McDonald, Sterner, Sara K., Sulzer, Mark

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Annotated Bibliography of Research in the Teaching of English von Ortmann, Lisa, Crampton, Anne, Stutelberg, Erin, Beach, Richard, Martin-Kerr, Keitha-Gail, Peterson, Debra, Schick, Anna, Kelley, Bridget, Lambert, Charles, Pyscher, Tracey, Robinson, LeAnne, Cole, Mikel, Allen, Kathryn, Doerr-Steven, Candance, Israelson, Madeleine, Jocius, Robin, Murphy, Tracey, Yoon, Stephanie Rollag, Gambino, Andrea, Share, Jeff, Madison, Stephanie M., Brodeur, Katherine, Frederick, Amy, Ittner, Anne, Deventer, Megan McDonald Van, O’Byrne, Ian, Sterner, Sara K., Sulzer, Mark

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