Dislocation core and pipe diffusion in Y2O3 von Gaboriaud, R J

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Disorder–order phase transformation in a fluorite-related oxide thin film: In-situ X-ray diffraction and modelling of the residual stress effects von Gaboriaud, R.J., Paumier, F., Lacroix, B.

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Yttrium oxide thin films, Y2O3, grown by ion beam sputtering on Si von Gaboriaud, R J, Pailloux, F, Guerin, P, Paumier, F

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Synthesis, structuring and characterization of rare earth oxide thin films: Modeling of the effects of stress and defects on the phase stability von Gaboriaud, R.J., Paumier, F., Lacroix, B.

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Y2O3 thin films: internal stress and microstructure von Gaboriaud, R.J, Paumier, F, Pailloux, F, Guerin, P

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Microstructure of (Ti,Si,Al)N nanocomposite coatings von Carvalho, S, Rebouta, L, Ribeiro, E, Vaz, F, Denannot, M.F, Pacaud, J, Rivière, J.P, Paumier, F, Gaboriaud, R.J, Alves, E

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Yttrium sesquioxide, Y2O3, thin films deposited on Si by ion beam sputtering: microstructure and dielectric properties von GABORIAUD, R. J, PAILLOUX, F, GUERIN, P, PAUMIER, F

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Interfacial phases in epitaxial growth of Y2O3 on MgO studied via combining electron energy-loss spectroscopy and real-space self-consistent full multiple scattering calculations von PAILLOUX, F, JUBLOT, M, GABORIAUD, R. J, JAOUEN, M, PAUMIER, F, IMHOFF, D

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Microstructural investigations of Y2O3 thin films deposited by laser ablation on MgO von GABORIAUD, R. J, PAILLOUX, F, PACAUD, J, RENAULT, P. O, PERRIERE, J, HUIGNARD, A

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Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure von Jublot, M., Paumier, F., Pailloux, F., Lacroix, B., Leau, E., Guérin, P., Marteau, M., Jaouen, M., Gaboriaud, R.J., Imhoff, D.

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Interfacial reactions in Y2O3 thin films deposited on Si(100) von PAUMIER, F, GABORIAUD, R. J

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Epitaxial bilayers and trilayers of superconducting and high K materials grown by PLD for microwave applications von Delage, T., Champeaux, C., Catherinot, A., Seaux, J.F., Madrangeas, V., Cros, D., Pailloux, F., Gaboriaud, R.J.

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Electron energy--loss spectroscopy investigation of Y2O3 films on Si (001) substrate von Zhang, J, Paumier, F, Hoche, T, Heyroth, F, Syrowatka, F, Gaboriaud, R J, Leipner, H S

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Ion irradiation-induced phase transformation mechanisms in Y2O3 thin films von Gaboriaud, R.J., Paumier, F., Jublot, M., Lacroix, B.

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Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moiré fringe pattern von Pailloux, F, Gaboriaud, R.J, Champeaux, C, Catherinot, A

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Yttrium oxide thin films: chemistry- stoichiometry-strain and microstructure von Paumier, F, Gaboriaud, R.J, Kaul, A.R

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AFM, SEM, EDX and HRTEM study of the crystalline growth rate anisotropy-induced internal stress and surface roughness of YBaCuO thin film von Pailloux, F, Gaboriaud, R.J, Champeaux, C, Catherinot, A

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Phase transformations in Y2O3 thin films under swift Xe ions irradiation von Gaboriaud, R.J., Jublot, M., Paumier, F., Lacroix, B.

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Crystalline growth rate and microstructure in YBaCuO thin films von Pailloux, F., Gaboriaud, R.J., Champeaux, C., Catherinot, A.

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HRTEM and EELS study of Y2O3/MgO thin films von Pailloux, F., Imhoff, D., Jublot, M., Paumier, F., Gaboriaud, R.J., Jaouen, M.

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