Sample preparation by focused ion beam without argon ion milling for quantitative electron holography of p-n junctions von Gribelyuk, M. A., Mody, J., Kaganer, E., Furkay, S. S., Miller, J., Charsky, A.

Volltext

Crystallographic-Orientation-Dependent Gate-Induced Drain Leakage in Nanoscale MOSFETs von Pandey, R K, Murali, K V R M, Furkay, S S, Oldiges, P J, Nowak, E J

Volltext

Ab initio Study of Metal Grain Orientation-Dependent Work Function and its Impact on FinFET Variability von Agarwal, Samarth, Pandey, Rajan Kumar, Johnson, Jeffrey B., Dixit, Abhisek, Bajaj, Mohit, Furkay, Stephen S., Oldiges, Phil J., Murali, K. V. R. M.

Volltext

Modeling and Characterization of Gate Leakage in High-K Metal Gate Technology-Based Embedded DRAM von Bajaj, Mohit, Pandey, Rajan K., De, Sandip, Sathaye, Ninad D., Jayaraman, Balaji, Krishnan, Rishikesh, Goyal, Puneet, Furkay, Stephen S., Nowak, Edward J., Iyer, Subramanian S., Murali, Kota V. R. M.

Volltext

Hybrid methodology to model random dopant fluctuations in low doped FinFETs von Agarwal, Samarth, Johnson, Jeffrey B., Bajaj, Mohit, Furkay, Stephen S., Oldiges, Philip J., Robison, Robert R., Murali, K. V. R. M.

Volltext

Structural dependence of the thermal resistance of trench-isolated bipolar transistors von Rieh, J.-S., Johnson, J., Furkay, S., Greenberg, D., Freeman, G., Subbanna, S.

Volltext

TCAD study of back-gate biasing in UTBB von Hook, T. B., Furkay, S., Kulkarni, P., Monsieur, F.

Volltext

Exploring MOL design options for a 20nm CMOS technology using TCAD von Scholze, A., Furkay, S., Seong-Dong Kim, Jain, S.

Volltext

Measurement and 3D simulations of substrate noise isolation and resistance for mixed signal applications von Rajendran, K., Johnson, J.B., Furkay, S., Kumar, M., Fischer, S.

Volltext bestellen

The use of simulation in semiconductor technology development von Cole, D.C., Buturla, E.M., Furkay, S.S., Varahramyan, K., Slinkman, J., Mandelman, J.A., Foty, D.P., Bula, O., Strong, A.W., Park, J.W., Linton, T.D., Johnson, J.B., Fischetti, M.V., Laux, S.E., Cottrell, P.E., Lustig, H.G., Pileggi, F., Katcoff, D.

Volltext

Laser Doppler anemometer studies in unsteady ventricular flows von Phillips, W M, Furkay, S S, Pierce, W S

Volltext

Three-dimensional transient electrothermal simulation of electrostatic discharge protection circuits von Voldman, Steven H., Furkay, Stephen S., Slinkman, James R.

Volltext

Analysis of snubber-clamped diode-string mixed voltage interface ESD protection network for advanced microprocessors von Voldman, S.H., Gerosa, G., Gross, V.P., Dickson, N., Furkay, S., Slinkman, J.

Volltext bestellen

Analysis of snubber-clamped diode-string mixed voltage interface ESD protection network for advanced microprocessors von Voldman, Steven H., Gerosa, Gianfranco, Gross, Vaughn P., Dickson, Nicholas, Furkay, Stephen, Slinkman, James

Volltext

METHOD OF MODELING CONCENTRATION OF REDUCIBLE MOBILE IONIC DOPANT IN SEMICONDUCTOR DEVICE SIMULATOR von BAJAJ MOHIT, FURKAY STEPHEN S, VENKATARAMAN KARTHIK

Volltext bestellen

Electrostatic discharge and high current pulse characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors von Voldman, S., Juliano, P., Johnson, R., Schmidt, N., Joseph, A., Furkay, S., Rosenbaum, E., Dunn, J., Harame, D., Meyerson, B.

Volltext bestellen

MEMORY DEVICE CONTAINING PHASE CHANGE MATERIAL, SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD OF SAME von STEPHEN S FURKAY, LAM CHUNG H, JOHNSON JEFFREY B, HON-SUM P WONG, HENDRICK HAMANN

Volltext bestellen

METHOD FOR FORMING A ONE MASK HYPERABRUPT JUNCTION VARACTOR USING A COMPENSATED CATHODE CONTACT von JOHNSON, JEFFREY, B, COOLBAUGH, DOUGLAS, D, FURKAY, STEPHEN, S, RASSEL, ROBERT, M

Volltext bestellen

The use of simulation in semiconductor technology develoopment: Material and process characterizeation for semiconductor device simulation von COLE, D. C, BUTURLA, E. M, LINTON, T. D, JOHNSON, J. B, FISCHETTI, M. V, LAUX, S. E, COTTRELL, P. E, LUSTING, H. G, PILEGGI, F, KATCOFF, D, FURKAY, S. S, WARAHRAMYAN, K, SLINKMAN, J, MANDELMAN, J. A, FOTY, D. P, OBULA, O, STRONG, A. W, PARK, J. W

Volltext

Thermal characterization of plastic and ceramic surface-mount components von Furkay, S.S.

Volltext