High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography von Hruszkewycz, S. O., Allain, M., Holt, M. V., Murray, C. E., Holt, J. R., Fuoss, P. H., Chamard, V.

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Ferroelectricity in Ultrathin Perovskite Films von Fong, Dillon D., Stephenson, G. Brian, Streiffer, Stephen K., Eastman, Jeffrey A., Auciello, Orlando, Fuoss, Paul H., Thompson, Carol

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Quantitative Nanoscale Imaging of Lattice Distortions in Epitaxial Semiconductor Heterostructures Using Nanofocused X‑ray Bragg Projection Ptychography von Hruszkewycz, S. O, Holt, M. V, Murray, C. E, Bruley, J, Holt, J, Tripathi, A, Shpyrko, O. G, McNulty, I, Highland, M. J, Fuoss, P. H

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STRUCTURE OF GAAS = GASB INCOHERENT INTERFACE AFTER EPITAXIAL-GROWTH von BOURRET, A, FUOSS, PH

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Stabilization of monodomain polarization in ultrathin PbTiO3 films von Fong, D D, Kolpak, A M, Eastman, J A, Streiffer, S K, Fuoss, P H, Stephenson, G B, Thompson, Carol, Kim, D M, Choi, K J, Eom, C B, Grinberg, I, Rappe, A M

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X-ray scattering studies of the Si-SiO2 interface von FUOSS, P. H, NORTON, L. J, BRENNAN, S, FISCHER-COLBRIE, A

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X-ray scattering studies of the melting of lead surfaces von FUOSS, P. H, NORTON, L. J, BRENNAN, S

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Ultrafast Bond Softening in Bismuth: Mapping a Solid's Interatomic Potential with X-rays von Fritz, D.M, Reis, D.A, Adams, B, Akre, R.A, Arthur, J, Blome, C, Bucksbaum, P.H, Cavalieri, A.L, Engemann, S, Fahy, S, Falcone, R.W, Fuoss, P.H, Gaffney, K.J, George, M.J, Hajdu, J, Hertlein, M.P, Hillyard, P.B, Horn-von Hoegen, M, Kammler, M, Kaspar, J, Kienberger, R, Krejcik, P, Lee, S.H, Lindenberg, A.M, McFarland, B, Meyer, D, Montagne, T, Murray, É.D, Nelson, A.J, Nicoul, M, Pahl, R, Rudati, J, Schlarb, H, Siddons, D.P, Sokolowski-Tinten, K, Tschentscher, Th, Linde, D. von der, Hastings, J.B

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Nucleation and growth of epitaxial metal-oxide films based on polymer-assisted deposition von McCleskey, T. M, Shi, P, Bauer, E, Highland, M. J, Eastman, J. A, Bi, Z. X, Fuoss, P. H, Baldo, P. M, Ren, W, Scott, B. L, Burrell, A. K, Jia, Q. X

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Clocking femtosecond X rays von CAVALIERI, A. L, FRITZ, D. M, SIDDONS, D. P, LOWNEY, D. P, MACPHEE, A. G, WEINSTEIN, D, FALCONE, R. W, PAHL, R, ALS-NIELSEN, J, BLOME, C, DÜSTERER, S, ISCHEBECK, R, LEE, S. H, SCHLARB, H, SCHULTE-SCHREPPING, H, TSCHENTSCHER, Th, SCHNEIDER, J, HIGNETTE, O, SETTE, F, SOKOLOWSKI-TINTEN, K, CHAPMAN, H. N, LEE, R. W, HANSEN, T. N, BUCKSBAUM, P. H, SYNNERGREN, O, LARSSON, J, TECHERT, S, SHEPPARD, J, WARK, J. S, BERGH, M, CALEMAN, C, HULDT, G, VAN DER SPOEL, D, TIMNEANU, N, REIS, D. A, HAJDU, J, AKRE, R. A, BONG, E, EMMA, P, KREJCIK, P, ARTHUR, J, BRENNAN, S, GAFFNEY, K. J, LINDENBERG, A. M, LUENING, K, RUDATI, J, HASTINGS, J. B, MILLS, D. M, FUOSS, P. H, STEPHENSON, G. B, KAO, C. C

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Direct structural determination in ultrathin ferroelectric films by analysis of synchrotron x-ray scattering measurements von FONG, D. D, CIONCA, C, STERN, E. A, YACOBY, Y, STEPHENSON, G. B, EASTMAN, J. A, FUOSS, P. H, STREIFFER, S. K, THOMPSON, Carol, CLARKE, R, PINDAK, R

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X-Ray Diffraction Studies: Melting of Pb Monolayers on Cu(110) Surfaces von Marra, W. C., Fuoss, P. H., Eisenberger, P. E.

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The Si(001)/SiO2 interface von Ourmazd, A., Fuoss, P.H., Bevk, J., Morar, J.F.

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Modular instrument mounting system for variable environment in operando X-ray experiments von Folkman, C. M., Highland, M. J., Perret, E., Kim, S. K., Fister, T. T., Zhou, H., Baldo, P. M., Seifert, S., Eastman, J. A., Fuoss, P. H., Fong, D. D.

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Characterization of vapor phase growth using X-ray techniques von Kisker, D.W., Stephenson, G.B., Fuoss, P.H., Brennan, S.

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High energy electron accelerator based synchrotron radiation sources von Fuoss, P.H.

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TIME-RESOLVED X-RAY-SCATTERING STUDIES OF LAYER-BY-LAYER EPITAXIAL-GROWTH von FUOSS, PH, KISKER, DW, LAMELAS, FJ, STEPHENSON, GB, IMPERATORI, P, BRENNAN, S

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Early-stage suppression of Cu (001) oxidation von Eastman, J. A., Fuoss, P. H., Rehn, L. E., Baldo, P. M., Zhou, G.-W., Fong, D. D., Thompson, L. J.

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Surface Sensitive X-Ray Scattering von Fuoss, P H, Brennan, S

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X-ray scattering studies of intermediate-range order in amorphous GeSe2 von FISCHER-COLBRIE, A, FUOSS, P. H

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