Effects of stacking sequence on the impact resistance in composite laminates — Part 1: parametric study von Fuoss, Edgar, Straznicky, Paul V., Poon, Cheung

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Prediction of Impact-Induced Delamination in Composite Plates von Fuoss, E., Straznicky, P. V., Poon, C.

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Effects of stacking sequence on the impact resistance in composite laminates. Part 2: prediction method von Fuoss, Edgar, Straznicky, Paul V., Poon, Cheung

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Improved physics for simulating submicron bipolar devices von Bennett, H.S., Fuoss, D.E.

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Effects of stacking sequence on the impact resistance of composite laminates. I. Parametric study von Straznicky, P V, Fuoss, E, Poon, C

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Effects of stacking sequence on the impact resistance in composite laminates. II - Prediction method von Fuoss, Edgar, Straznicky, Paul V, Poon, Cheung

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Improved Physics for Simulating Submicron Bipolar Devices von Bennett, H.S., Fuoss, D.E.

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High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography von Hruszkewycz, S. O., Allain, M., Holt, M. V., Murray, C. E., Holt, J. R., Fuoss, P. H., Chamard, V.

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Quantitative Nanoscale Imaging of Lattice Distortions in Epitaxial Semiconductor Heterostructures Using Nanofocused X‑ray Bragg Projection Ptychography von Hruszkewycz, S. O, Holt, M. V, Murray, C. E, Bruley, J, Holt, J, Tripathi, A, Shpyrko, O. G, McNulty, I, Highland, M. J, Fuoss, P. H

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Prediction of impact-induced delamination in composite plates von Fuoss, E, Straznicky, P V, Poon, C

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Nucleation and growth of epitaxial metal-oxide films based on polymer-assisted deposition von McCleskey, T. M, Shi, P, Bauer, E, Highland, M. J, Eastman, J. A, Bi, Z. X, Fuoss, P. H, Baldo, P. M, Ren, W, Scott, B. L, Burrell, A. K, Jia, Q. X

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Ultrafast Bond Softening in Bismuth: Mapping a Solid's Interatomic Potential with X-rays von Fritz, D.M, Reis, D.A, Adams, B, Akre, R.A, Arthur, J, Blome, C, Bucksbaum, P.H, Cavalieri, A.L, Engemann, S, Fahy, S, Falcone, R.W, Fuoss, P.H, Gaffney, K.J, George, M.J, Hajdu, J, Hertlein, M.P, Hillyard, P.B, Horn-von Hoegen, M, Kammler, M, Kaspar, J, Kienberger, R, Krejcik, P, Lee, S.H, Lindenberg, A.M, McFarland, B, Meyer, D, Montagne, T, Murray, É.D, Nelson, A.J, Nicoul, M, Pahl, R, Rudati, J, Schlarb, H, Siddons, D.P, Sokolowski-Tinten, K, Tschentscher, Th, Linde, D. von der, Hastings, J.B

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Direct structural determination in ultrathin ferroelectric films by analysis of synchrotron x-ray scattering measurements von FONG, D. D, CIONCA, C, STERN, E. A, YACOBY, Y, STEPHENSON, G. B, EASTMAN, J. A, FUOSS, P. H, STREIFFER, S. K, THOMPSON, Carol, CLARKE, R, PINDAK, R

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Strain imaging of nanoscale semiconductor heterostructures with x-ray Bragg projection ptychography von Holt, Martin V, Hruszkewycz, Stephan O, Murray, Conal E, Holt, Judson R, Paskiewicz, Deborah M, Fuoss, Paul H

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In-situ synchrotron x-ray studies of the microstructure and stability of In2O3 epitaxial films von Highland, M. J., Hruszkewycz, S. O., Fong, D. D., Thompson, Carol, Fuoss, P. H., Calvo-Almazan, I., Maddali, S., Ulvestad, A., Nazaretski, E., Huang, X., Yan, H., Chu, Y. S., Zhou, H., Baldo, P. M., Eastman, J. A.

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Oxygen Exchange in La0.6Sr0.4Co0.2Fe0.8O3−δ Thin-Film Heterostructures under Applied Electric Potential von Hopper, E. Mitchell, Perret, Edith, Ingram, Brian J, You, Hoydoo, Chang, Kee-Chul, Baldo, Peter M, Fuoss, Paul H, Eastman, Jeffrey A

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Atomic-Scale Visualization of Inertial Dynamics von Lindenberg, A. M, Larsson, J, Sokolowski-Tinten, K, Gaffney, K. J, Blome, C, Synnergren, O, Sheppard, J, Caleman, C, MacPhee, A. G, Weinstein, D, Lowney, D. P, Allison, T. K, Matthews, T, Falcone, R. W, Cavalieri, A. L, Fritz, D. M, Lee, S. H, Bucksbaum, P. H, Reis, D. A, Rudati, J, Fuoss, P. H, Kao, C. C, Siddons, D. P, Pahl, R, Als-Nielsen, J, Duesterer, S, Ischebeck, R, Schlarb, H, Schulte-Schrepping, H, Tschentscher, Th, Schneider, J, von der Linde, D, Hignette, O, Sette, F, Chapman, H. N, Lee, R. W, Hansen, T. N, Techert, S, Wark, J. S, Bergh, M, Huldt, G, van der Spoel, D, Timneanu, N, Hajdu, J, Akre, R. A, Bong, E, Krejcik, P, Arthur, J, Brennan, S, Luening, K, Hastings, J. B

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Efficient modeling of Bragg coherent x-ray nanobeam diffraction von Hruszkewycz, S O, Holt, M V, Allain, M, Chamard, V, Polvino, S M, Murray, C E, Fuoss, P H

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Resonant X-ray scattering studies of epitaxial complex oxide thin films von Perret, Edith, Park, Changyong, Fong, Dillon D., Chang, Kee-Chul, Ingram, Brian J., Eastman, Jeffrey A., Baldo, Peter M., Fuoss, Paul H.

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Modular instrument mounting system for variable environment in operando X-ray experiments von Folkman, C. M., Highland, M. J., Perret, E., Kim, S. K., Fister, T. T., Zhou, H., Baldo, P. M., Seifert, S., Eastman, J. A., Fuoss, P. H., Fong, D. D.

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