Pressure-Temperature history of Bixiling complex, Dabie region, eastern China von Fujise, Takeru, Nakamura, Daisuke, Hirajima, Takao

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H2O content in Low-T UHP eclogite von Fujise, Takeru, Nakamura, Daisuke, Hirajima, Takao

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中国東部大別山地域Bixiling複合岩体の温度圧力履歴 von 藤瀬, 武尊, 中村, 大輔, 平島, 崇男

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低温超高圧エクロジャイト中のH2O含有量 von 藤瀬, 武尊, 中村, 大輔, 平島, 崇男

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Orbital effects on tunnel-electron momentum distributions: Ar and H2 studied by electron–ion coincidence momentum imaging von Ikeya, Daimu, Fujise, Hikaru, Inaba, Shinnosuke, Takahashi, Minami, Yamamoto, Masateru, Nakamura, Takeru, Nagao, Yu, Matsuda, Akitaka, Fushitani, Mizuho, Hishikawa, Akiyoshi

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Orbital effects on tunnel-electron momentum distributions: Ar and H 2 studied by electron–ion coincidence momentum imaging von Ikeya, Daimu, Fujise, Hikaru, Inaba, Shinnosuke, Takahashi, Minami, Yamamoto, Masateru, Nakamura, Takeru, Nagao, Yu, Matsuda, Akitaka, Fushitani, Mizuho, Hishikawa, Akiyoshi

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TWI802962B von FUJISE, JUN, TAKUSHIMA, TAKERU, ONO, TOSHIAKI

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Method to reduce the probability of cracking of the semiconductor wafer von FUJISE, JUN, TAKUSHIMA, TAKERU, ONO, TOSHIAKI

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