Dislocation structure of Ge crystals grown by low thermal gradient Czochralski technique von Trukhanov, E.M., Fritzler, K.B., Vasilenko, A.P., Kolesnikov, A.V., Kasimkin, P.V., Moskovskih, V.A.

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Evolution of film stress with accumulation of misfit dislocations at semiconductor interfaces von Trukhanov, E.M., Fritzler, K.B., Lyubas, G.A., Kolesnikov, A.V.

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