An introduction to three-dimensional X-ray diffraction microscopy von Poulsen, Henning Friis

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Long-range symmetry breaking in embedded ferroelectrics von Simons, Hugh, Haugen, Astri Bjørnetun, Jakobsen, Anders Clemen, Schmidt, Søren, Stöhr, Frederik, Majkut, Marta, Detlefs, Carsten, Daniels, John E., Damjanovic, Dragan, Poulsen, Henning Friis

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High‐resolution 3D X‐ray diffraction microscopy: 3D mapping of deformed metal microstructures von Kutsal, Mustafacan, Poulsen, Henning Friis, Winther, Grethe, Sørensen, Henning Osholm, Detlefs, Carsten

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Simulations of dislocation contrast in dark‐field X‐ray microscopy von Borgi, Sina, Ræder, Trygve Magnus, Carlsen, Mads Allerup, Detlefs, Carsten, Winther, Grethe, Poulsen, Henning Friis

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Probing nanoscale structure and strain by dark-field x-ray microscopy von Yildirim, Can, Cook, Phil, Detlefs, Carsten, Simons, Hugh, Poulsen, Henning Friis

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Fast and quantitative 2D and 3D orientation mapping using Raman microscopy von Ilchenko, Oleksii, Pilgun, Yuriy, Kutsyk, Andrii, Bachmann, Florian, Slipets, Roman, Todeschini, Matteo, Okeyo, Peter Ouma, Poulsen, Henning Friis, Boisen, Anja

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Characterization of Pt-coated twin paraboloidal laboratory capillary high energy X-ray optics von Seret, Anthony, Kehres, Jan, Gundlach, Carsten, Lund Olsen, Ulrik, Friis Poulsen, Henning, Juul Jensen, Dorte, Cordier, Mark, Stripe, Benjamin, Yun, Wenbing, Zhang, Yubin

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Numerical study of Bragg CDI on thick polycrystalline specimens von Pedersen, Anders Filsøe, Chamard, Virginie, Poulsen, Henning Friis

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Determining grain resolved stresses in polycrystalline materials using three-dimensional X-ray diffraction von Oddershede, Jette, Schmidt, Søren, Poulsen, Henning Friis, Sørensen, Henning Osholm, Wright, Jonathan, Reimers, Walter

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X‐ray free‐electron laser based dark‐field X‐ray microscopy: a simulation‐based study von Holstad, Theodor Secanell, Ræder, Trygve Magnus, Carlsen, Mads, Bergbäck Knudsen, Erik, Dresselhaus-Marais, Leora, Haldrup, Kristoffer, Simons, Hugh, Nielsen, Martin Meedom, Poulsen, Henning Friis

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The fractional Fourier transform as a simulation tool for lens‐based X‐ray microscopy von Pedersen, Anders Filsøe, Simons, Hugh, Detlefs, Carsten, Poulsen, Henning Friis

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Grain boundary strain localization in a CdTe solar cell revealed by scanning 3D X-ray diffraction microscopy von Shukla, Aditya, Wright, Jon, Henningsson, Axel, Stieglitz, Hergen, Colegrove, Eric, Besley, Luke, Baur, Christian, De Angelis, Salvatore, Stuckelberger, Michael, Poulsen, Henning Friis, Andreasen, Jens Wenzel

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Microstructure and stress mapping in 3D at industrially relevant degrees of plastic deformation von Henningsson, Axel, Kutsal, Mustafacan, Wright, Jonathan P., Ludwig, Wolfgang, Sørensen, Henning Osholm, Hall, Stephen A., Winther, Grethe, Poulsen, Henning Friis

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Polychromatic neutron phase‐contrast imaging of weakly absorbing samples enabled by phase retrieval von Østergaard, Maja, Naver, Estrid Buhl, Kaestner, Anders, Willendrup, Peter K., Brüel, Annemarie, Sørensen, Henning Osholm, Thomsen, Jesper Skovhus, Schmidt, Søren, Poulsen, Henning Friis, Theil Kuhn, Luise, Birkedal, Henrik

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X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. I. Direct beam case von Ludwig, Wolfgang, Schmidt, Søeren, Lauridsen, Erik Mejdal, Poulsen, Henning Friis

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Measuring the stress field around an evolving crack in tensile deformed Mg AZ31 using three-dimensional X-ray diffraction von Oddershede, Jette, Camin, Bettina, Schmidt, Søren, Mikkelsen, Lars P., Sørensen, Henning Osholm, Lienert, Ulrich, Poulsen, Henning Friis, Reimers, Walter

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McXtrace: a Monte Carlo software package for simulating X-ray optics, beamlines and experiments von Bergbäck Knudsen, Erik, Prodi, Andrea, Baltser, Jana, Thomsen, Maria, Kjær Willendrup, Peter, Sanchez del Rio, Manuel, Ferrero, Claudio, Farhi, Emmanuel, Haldrup, Kristoffer, Vickery, Anette, Feidenhans'l, Robert, Mortensen, Kell, Meedom Nielsen, Martin, Friis Poulsen, Henning, Schmidt, Søren, Lefmann, Kim

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On the Use of Laguerre Tessellations for Representations of 3D Grain Structures von Lyckegaard, Allan, Lauridsen, Erik Mejdal, Ludwig, Wolfgang, Fonda, Richard Warren, Poulsen, Henning Friis

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Grain-resolved elastic strains in deformed copper measured by three-dimensional X-ray diffraction von Oddershede, Jette, Schmidt, Søren, Poulsen, Henning Friis, Margulies, Lawrence, Wright, Jonathan, Moscicki, Marcin, Reimers, Walter, Winther, Grethe

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Multi-Scale 3D Imaging of Strain and Structure with Dark-Field X-Ray Microscopy von Simons, Hugh, Ahl, Sonja Rosenlund, Jakobsen, Anders Clemen, Yildirim, Can, Cook, Phil K., Detlefs, Carsten, Poulsen, Henning Friis

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