Risk factors associated with lymphedema after lymph node dissection in melanoma patients von Friedman, Jeffrey F., M.S.E, Sunkara, Bipin, B.A, Jehnsen, Jennifer S., B.S, Durham, Allison, M.D, Johnson, Timothy, M.D, Cohen, Mark S., M.D., F.A.C.S

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One-year postoperative resource utilization in sarcopenic patients von Kirk, Peter S., BA, Friedman, Jeffrey F., BS, MS, Cron, David C., BS, Terjimanian, Michael N., BS, MS, Wang, Stewart C., MD, PhD, Campbell, Darrell A., MD, Englesbe, Michael J., MD, Werner, Nicole L., MD, MS

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Quality of Life in Liver Transplant Candidates: Frailty Is a Better Indicator Than Severity of Liver Disease von Derck, Jordan Elizabeth, Thelen, Angela E, Cron, David C, Friedman, Jeffrey F, Gerebics, Ashley D, Englesbe, Michael J, Sonnenday, Christopher J

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Starting a Surgical Home von Englesbe, Michael J, Lussiez, Alisha D, Friedman, Jeffrey F, Sullivan, June A, Wang, Stewart C

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The impact of hindsight bias on the diagnosis of perioperative events by anesthesia providers: A multicenter randomized crossover study von Millan, Patrick D., Kleiman, Amanda M., Friedman, Jeffrey F., Dunn, Lauren K., Gui, Jane L., Bechtel, Allison J., Collins, Stephen R., Huffmyer, Julie L., Dwivedi, Priyanka, Wolpaw, Jed T., Nemergut, Edward C., Tsang, Siny, Forkin, Katherine T.

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Can Comprehensive Imaging Analysis with Analytic Morphomics and Geriatric Assessment Predict Serious Complications in Patients Undergoing Pancreatic Surgery? von Benjamin, Andrew J., Buschmann, Mary M., Schneider, Andrew, Derstine, Brian A., Friedman, Jeffrey F., Wang, Stewart C., Dale, William, Roggin, Kevin K.

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Electron attachment and detachment and the electron affinity of cyclo-C4F8 von Miller, Thomas M, Friedman, Jeffrey F, Viggiano, A A

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Electron attachment to 14 halogenated alkenes and alkanes, 300-600 K von Shuman, Nicholas S, Friedman, Jeffrey F, Miller, Thomas M, Viggiano, A A

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Pressure and temperature dependence of dissociative and non-dissociative electron attachment to CF3: experiments and kinetic modeling von Shuman, Nicholas S, Miller, Thomas M, Friedman, Jeffrey F, Viggiano, Albert A, Maergoiz, Anatol I, Troe, Jürgen

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Electron Attachment to Fe(CO) n (n = 0–5) von Shuman, Nicholas S, Miller, Thomas M, Friedman, Jeffrey F, Viggiano, Albert A

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Dissociative electron attachment to C2F5 radicals von Haughey, Sean A, Field, Thomas A, Langer, Judith, Shuman, Nicholas S, Miller, Thomas M, Friedman, Jeffrey F, Viggiano, A A

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Low-energy electron attachment to SF6. III. From thermal detachment to the electron affinity of SF6 von Viggiano, Albert A, Miller, Thomas M, Friedman, Jeffrey F, Troe, Jürgen

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Temperature dependences of rate coefficients for electron catalyzed mutual neutralization von Shuman, Nicholas S., Miller, Thomas M., Friedman, Jeffrey F., Viggiano, Albert A., Maeda, Satoshi, Morokuma, Keiji

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Electron Attachment to C7F14, Thermal Detachment from C7F14 –, the Electron Affinity of C7F14, and Neutralization of C7F14 – by Ar von Miller, Thomas M, Friedman, Jeffrey F, Shuman, Nicholas S, Ard, Shaun G, Melko, Joshua J, Viggiano, A. A

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Reactions of Ions with Ionic Liquid Vapors by Selected-Ion Flow Tube Mass Spectrometry von Chambreau, Steven D, Boatz, Jerry A, Vaghjiani, Ghanshyam L, Friedman, Jeffrey F, Eyet, Nicole, Viggiano, A. A

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A new instrument for thermal electron attachment at high temperature: NF3 and CH3Cl attachment rate constants up to 1100 K von Miller, Thomas M, Friedman, Jeffrey F, Williamson, John S, Schaffer, Linda C, Viggiano, A A

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Electron attachment to chlorine azide at 298 and 400 K von Freel, Keith, Friedman, Jeffrey F., Miller, Thomas M., Heaven, Michael C., Viggiano, A. A.

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Electron attachment to Ni(PF(3))(4) and Pt(PF(3))(4) von Friedman, Jeffrey F, Miller, Thomas M, Friedman-Schaffer, Jessica K, Viggiano, A A, Rekha, G K, Stevens, Amy E

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Electron attachment to sulfur oxyhalides: SOF2, SOCl2, SO2F2, SO2Cl2, and SO2FCl attachment rate coefficients, 300-900 K von Miller, Thomas M, Friedman, Jeffrey F, Caples, Connor M, Shuman, Nicholas S, Van Doren, Jane M, Bardaro, Jr, Michael F, Nguyen, Pho, Zweiben, Cindy, Campbell, Matthew J, Viggiano, A A

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Electron attachment to propargyl chloride, 305-540 K von Bopp, Joseph C., Miller, Thomas M., Friedman, Jeffrey F., Shuman, Nicholas S., Viggiano, A. A.

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