Investigation of Combinatorial WO3-MoO3 Mixed Layers by Spectroscopic Ellipsometry Using Different Optical Models von Fried, Miklos, Bogar, Renato, Takacs, Daniel, Labadi, Zoltan, Horvath, Zsolt Endre, Zolnai, Zsolt

Volltext

Mapping and Imaging of Thin Films on Large Surfaces von Petrik, Peter, Fried, Miklos

Volltext

Scanning-resonance optical sensing based on a laterally graded plasmonic layer—optical properties of AgxAl1−x in the range of x=0 to 1 von Kalas, Benjamin, Sáfrán, György, Serényi, Miklós, Fried, Miklós, Petrik, Péter

Volltext

Compositional Optimization of Sputtered SnO2/ZnO Films for High Coloration Efficiency von Lábadi, Zoltán, Ismaeel, Noor Taha, Petrik, Péter, Fried, Miklós

Volltext

Investigation of Electrochromic, Combinatorial TiO2-SnO2 Mixed Layers by Spectroscopic Ellipsometry Using Different Optical Models von Ismaeel, Noor Taha, Lábadi, Zoltán, Petrik, Peter, Fried, Miklós

Volltext

Compositional Optimization of Sputtered WO3/MoO3 Films for High Coloration Efficiency von Lábadi, Zoltán, Takács, Dániel, Zolnai, Zsolt, Petrik, Péter, Fried, Miklós

Volltext

Flagellin-based electrochemical sensing layer for arsenic detection in water von Jankovics, Hajnalka, Szekér, Patrik, Tóth, Éva, Kakasi, Balázs, Lábadi, Zoltán, Saftics, András, Kalas, Benjamin, Fried, Miklós, Petrik, Péter, Vonderviszt, Ferenc

Volltext

Membrane-Based In Situ Mid-Infrared Spectroscopic Ellipsometry: A Study on the Membrane Affinity of Polylactide-co-glycolide Nanoparticulate Systems von Romanenko, Alekszej, Kalas, Benjamin, Hermann, Petra, Hakkel, Orsolya, Illés, Levente, Fried, Miklós, Fürjes, Peter, Gyulai, Gergö, Petrik, Peter

Volltext

Bloch surface waves biosensing in the ultraviolet wavelength range – Bragg structure design for investigating protein adsorption by in situ Kretschmann-Raether ellipsometry von Kalas, Benjamin, Ferencz, Karpat, Saftics, Andras, Czigany, Zsolt, Fried, Miklos, Petrik, Peter

Volltext

Optical models for ultrathin oxides on Si- and C-terminated faces of thermally oxidized SiC von Petrik, Peter, Szilágyi, Edit, Lohner, Tivadar, Battistig, Gabor, Fried, Miklos, Dobrik, Gergely, Biró, László P.

Volltext

Micro-combinatorial sampling of the optical properties of hydrogenated amorphous Si1-xGex for the entire range of compositions towards a database for optoelectronics von Kalas, Benjamin, Zolnai, Zsolt, Sáfrán, György, Serényi, Miklós, Agocs, Emil, Lohner, Tivadar, Nemeth, Attila, Khánh, Nguyen Quoc, Fried, Miklós, Petrik, Peter

Volltext

Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires von Fodor, Bálint, Defforge, Thomas, Agócs, Emil, Fried, Miklós, Gautier, Gaël, Petrik, Péter

Volltext

Gold Nanorod Plasmon Resonance Damping Effects on a Nanopatterned Substrate von Zolnai, Zsolt, Zámbó, Dániel, Osváth, Zoltán, Nagy, Norbert, Fried, Miklós, Németh, Attila, Pothorszky, Szilárd, Szekrényes, Dániel Péter, Deák, András

Volltext

Characterisation of Channel Waveguides Fabricated in an Er3+-Doped Tellurite Glass Using Two Ion Beam Techniques von Bányász, István, Rajta, Istvan, Nagy, Gyula U. L., Khanh, Nguyen Q., Havránek, Vladimír, Vosecek, Vaclav, Fried, Miklós, Szabó, Zoltán, Veres, Miklós, Holomb, Roman, Himics, László, Tichy-Rács, Éva

Volltext

Micro-combinatorial sampling of the optical properties of hydrogenated amorphous Si 1-x Ge x for the entire range of compositions towards a database for optoelectronics von Kalas, Benjamin, Zolnai, Zsolt, Safran, Gyoergy, Serenyi, Miklos, Agocs, Emil, Lohner, Tivadar, Nemeth, Attila, Khanh, Nguyen Quoc, Fried, Miklos, Petrik, Peter

Volltext

Spectroellipsometric detection of silicon substrate damage caused by radiofrequency sputtering of niobium oxide von Lohner, Tivadar, Serényi, Miklós, Szilágyi, Edit, Zolnai, Zsolt, Czigány, Zsolt, Khánh, Nguyen Quoc, Petrik, Péter, Fried, Miklós

Volltext

Disorder and cavity evolution in single-crystalline Ge during implantation of Sb ions monitored in-situ by spectroscopic ellipsometry von Lohner, Tivadar, Németh, Attila, Zolnai, Zsolt, Kalas, Benjamin, Romanenko, Alekszej, Khánh, Nguyen Quoc, Szilágyi, Edit, Kótai, Endre, Agócs, Emil, Tóth, Zsolt, Budai, Judit, Petrik, Péter, Fried, Miklós, Bársony, István, Gyulai, József

Volltext

Plasmon-enhanced two-channel in situ Kretschmann ellipsometry of protein adsorption, cellular adhesion and polyelectrolyte deposition on titania nanostructures von Nador, Judit, Kalas, Benjamin, Saftics, Andras, Agocs, Emil, Kozma, Peter, Korosi, Laszlo, Szekacs, Inna, Fried, Miklos, Horvath, Robert, Petrik, Peter

Volltext

Porosity and thickness characterization of porous Si and oxidized porous Si layers – An ultraviolet–visible–mid infrared ellipsometry study von Fodor, Balint, Agocs, Emil, Bardet, Benjamin, Defforge, Thomas, Cayrel, Frederic, Alquier, Daniel, Fried, Miklos, Gautier, Gael, Petrik, Peter

Volltext

Ellipsometric and X‐Ray Spectrometric Investigation of Fibrinogen Protein Layers von Kalas, Benjamin, Pollakowski, Beatrix, Nutsch, Andreas, Streeck, Cornelia, Nador, Judit, Fried, Miklós, Beckhoff, Burkhard, Petrik, Péter

Volltext