X-ray microbeam characterisation of crystalline defects in small pixel GaAs:Cr detectors von Wheater, R.M., Jowitt, L., Richards, S., Veale, M.C., Wilson, M.D., Fox, O.J.L., Sawhney, K.J.S., Lozinskaya, A.D., Shemeryankina, A., Tolbanov, O.P., Tyazhev, A., Zarubin, A.N.

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The role of inert gas in MW-enhanced plasmas for the deposition of nanocrystalline diamond thin films von Fox, O.J.L., Ma, J., May, P.W., Ashfold, M.N.R., Mankelevich, Yu.A.

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