TCAD modeling of bulk radiation damage effects in silicon devices with the Perugia radiation damage model von Asenov, Patrick, Arcidiacono, Roberta, Cartiglia, Nicolo, Croci, Tommaso, Ferrero, Marco, Fondacci, Alessandro, Morozzi, Arianna, Moscatelli, Francesco, Passeri, Daniele, Sola, Valentina

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Characterisation of the FBK EXFLU1 thin sensors with gain in a high fluence environment von White, Robert Stephen, Arcidiacono, Roberta, Borghi, Giacomo, Boscardin, Maurizio, Cartiglia, Nicolò, Vignali, Matteo Centis, Costa, Marco, Croci, Tommaso, Ferrero, Marco, Fondacci, Alessandro, Giordanengo, Simona, Hanna, Cecilia, Lanteri, Leonardo, Menzio, Luca, Morozzi, Arianna, Moscatelli, Francesco, Mulargia, Roberto, Passeri, Daniele, Pastrone, Nadia, Paternoster, Giovanni, Sola, Valentina

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A Compensated Design of the LGAD Gain Layer von Sola, Valentina, Arcidiacono, Roberta, Asenov, Patrick, Borghi, Giacomo, Boscardin, Maurizio, Cartiglia, Nicolò, Vignali, Matteo Centis, Croci, Tommaso, Ferrero, Marco, Fondacci, Alessandro, Gioachin, Giulia, Giordanengo, Simona, Lantieri, Leonardo, Mandurrino, Marco, Menzio, Luca, Monaco, Vincenzo, Morozzi, Arianna, Moscatelli, Francesco, Passeri, Daniele, Pastrone, Nadia, Paternoster, Giovanni, Siviero, Federico, Staiano, Amedeo, Tornago, Marta

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